Hewlett-Packard Application Notes

Table of Contents

This page contains a well formatted list of Hewlett-Packard's Application Notes that I built using different sources found in Internet (see References for a complete list). All pages have been enhanced with image optimization and OCR (Optical Character Recognition).

If you have the pdf of any document not already present, found errors, make suggestions or just for a simple thanksgiving feel free to send me an email at iv3cve#_@_#irh.it (remove # and _ characters).

Indexes

Year Application Notes range
1962 Application Notes from 1 to 57
1963 Application Notes from 1 to 57
1967 Application Notes from 3 to 917; without many old Application Notes
1970 Application Notes Index
1973 Application Notes Index February
1975 Application Notes Index October
1980 Application Notes Measurement computation
1981 Application Notes Index
1984 Application Notes Index
1989 Application Notes 50 Year (well organized)

Application Notes

Reference Year Instrument Title Keysight
AN-01 1958 - Measurement of FM Signals 10 - 12.4 GHz  
AN-02 1958 - Measuring frequency from VHF up to and above 18 GHz with transfer osc/counter tech  
AN-03 1958 - Measurement of Carrier Frequency of RF Pulses  
AN-04 ? AC-4A Model AC-4A Decade Counter  
AN-05 ? AC-4D Model AC-4D Decade Counter Unit  
AN-06 1960 - Homodyne Generator and Detection System  
AN-06-65 1965 69XX DC Power Supplies - Harrison/HP  
AN-07 ? 430C Hewlett-Packard Model 430C Microwave Power Meter Accuracy  
AN-09 ? 490A Doppler Frequency Shift Simulation at Microwave Frequencies using Traveling Wave Tube Amplifier  
AN-10 ? - Microwave Spectrum Synthesis with the Traveling-Wave Tube  
AN-11 1955 - Domesticating the Traveling Wave Tube  
AN-12 1959 - How a Helix Backward-Wave Tube Works  
AN-13 ? - A modular approach to the production of general purpose guided missile radar simulators  
AN-14 1955 49X Traveling-Wave Tube Amplifiers  
AN-15 1955 - Distortion and Intermodulation  
AN-16 1964 - Waves on Transmission Lines  
AN-17 1966 - Square Wave & Pulse Testing of Linear Systems  
AN-18 1959 - Introduction to Solid State Devices  
AN-19 ? - A technique for calibration phase shifters  
AN-20 1961 612A Signal Generator Output Attenuators  
AN-20 1965 612A HP Signal Generator Output Attenuators  
AN-21 1961 - Microwave Standards Prospectus  
AN-22 1960 560 561 Use of Digital Recorders with Digital Voltmeters  
AN-23 1960 684/5/6/7 Fast Pulsing of 684/5/6/7 Sweep Oscillators Manufactured Prior to March 1960  
AN-24 ? - Pulse Modulation of Audio Oscillators  
AN-25 1961 120-130-1XX Cathode Ray Tube Phosphors and the Internal Graticule Cathode Ray Tube  
AN-26 ? 721A Parallel 721A Operation  
AN-27 1961 475x 477 485 487 Basic Microwave Measurements  
AN-28 1960 560 Drift Measurements on High Stability Signals  
AN-29 ? - A Convenient Method for Measuring Phase Shift (With CRT Graticul Mask)  
AN-30 1964 608-803-417 Measurement of Cable Characteristics  
AN-31 ? 202A Externally Driving the 202A Low Frequency Function Generator  
AN-32 1963 50X-56X Guide for Selecting HP and DYMEC Digitizing Instruments for Specific Applications  
AN-33 1959 460A/B Accessories for the Model 460A/B Amplifiers  
AN-34 1959 154A AC Current Measurements  
AN-35 1959 - Masers and Parametric Amplifiers  
AN-36 ? - Sampling Oscillography  
AN-37 1959 120A-130A Monitoring a Radio Transmitter Signal with a 120A or 130A Oscilloscope  
AN-38 1962 - Microwave Measurements for Calibration Laboratories  
AN-39 1961 - Standards Calibration Procedures  
AN-40 1960 - HP Electronics instrumentation for transducer applications  
AN-41A 1960 405AR A Hold-Off Circuit for the Model 405AR Digital Voltmeter  
AN-41B 1960 405AR Increased Resolution for Permanent Records of DC Voltage with hp Model 405AR  
AN-41C 1960 405AR Remote Indications of DC Voltages with the 405AR Digital Voltmeter  
AN-41D 1960 405AR Decreasing the Response Time of the Model 405 Input Filter  
AN-42 1960 416A Applications of the 416A Ratio Meter  
AN-43 1960 344A Continuous Monitoring of Radar Noise Figure  
AN-44A 1960 185A Synchronizing the hp 185A Oscilloscope  
AN-44B 1960 185A More Information and Easier Pulse Analysis with the Model 185A Oscilloscope  
AN-44C ? 185A A method of automatically measuring component switching speed characteristics  
AN-44D 1960 18X Characteristics and Use of hp Sampling Oscilloscope Probe and Accessories  
AN-45 1963 428A Direct Reading Test Meter Simplifies Magnetic Ink Printing Quality Control  
AN-46 1960 - Introduction to microwave measurements. Incl bibliography  
AN-47 1961 524C-D Providing 100-, 1,000-, and 10,000-Second Gate Times for the hp Model 524C/D Counter  
AN-48 1965 218A Applications of the hp Model 218A, a Versatile General-Purpose Pulse and Delay Generator  
AN-49 1961 524 525 Measuring the Frequency of Small 10-100 MC Signals  
AN-50 1960 103AR 113AR Making VLF Frequency Comparison Measurements with hp Laboratory Instruments  
AN-51 1961 485B Modified 485B Provides Convenient and Economical Mixer for X- and H-band Laboratory Receivers  
AN-52 1965 5060A ++ Frequency and Time Standards  
AN-52-1 1974 - Fundamentals of Time and Frequency Standards  
AN-52-2 1975 - Timekeeping and Frequency Calibration  
AN-52-4 1986 - Contribution of HP Clocks to the BIH's International Atomic Time Scale (IATS)  
AN-53 1962 185B Transmission Line Testing Using the Sampling Oscilloscope  
AN-54 1964 416B The Ratio Meter in Microwave Swept-Frequency Measurements  
AN-55 1962 302A Converting the Model 302A Wave Analyzer for Use with Grounded-Input Recorders  
AN-56 1967 - Microwave Mismatch Error Analysis  
AN-57 1965 34X Noise Figure Primer  
AN-57-1 1983 8970A Fundamentals of RF and Microwave Noise Figure Measurements  
AN-57-1 2000 859X-NFA Agilent Fundamentals of RF and Microwave Noise Figure Measurements  
AN-57-1 2019 859X-NFA Keysight Fundamentals of RF and Microwave Noise Figure Measurements yes
AN-57-2 1988 8970B Noise Figure Measurement Accuracy  
AN-57-2 2001 8590X-346X Noise Figure Measurement Accuracy - The Y-Factor Method  
AN-57-2 2021 859X-NFA Noise Figure Measurement Accuracy - The Y-Factor Method yes
AN-57-3 2000 - Agilent 10 Hints for Making Successful Noise Figure Measurements  
AN-57-3 2019 - Keysight 10 Hints for Making Successful Noise Figure Measurements yes
AN-58 1963 - The PIN Diode as a Microwave Modulator  
AN-58 1967 - The PIN Diode as a Microwave Modulator  
AN-59 1965 310-1110A Loop Gain Measurement with hp Wave Analyzers  
AN-60 1967 4XX-34XX Which AC Voltmeter?  
AN-61 1964 690-691-130C Leveled Swept-Frequency Measurements with Oscilloscope Display  
AN-62 1964 1415A Time Domain Reflectometry  
AN-62 1988 54120T TDR Fundamentals - For Use with hp 54120T Digitizing Oscilloscope and TDR  
AN-62-1 1988 54120T Improving Time Domain Network Analysis Measurements  
AN-62-2 1990 54120 TDR Technics for Differential Systems  
AN-62-3 1990 541XX Advanced TDR Technics  
AN-63 1968 8551A Spectrum Analysis  
AN-63A 1965 8551A More on Spectrum Analysis  
AN-63B 1968 8441A The 8441A Preselector : Advancement in the Art of Spectrum Analysis  
AN-63C ? 8551A Measurement of White Noise Power Density  
AN-63D 1968 8551A-8406A Accurate Frequency Measurement: An Application of Spectrum Analysis  
AN-63E 1969 8551A Modern EMI Measurements  
AN-63E-1 1978 - Quasi-Peak Measurements Using a Spectrum Analyzer  
AN-63E-1 ? - Quasi-Peak Measurements Using a Spectrum Analyzer - Corrective of AN63E-1 Above  
AN-64 1965 430C Microwave Power Measurement  
AN-64 1968 43X Microwave Power Measurement  
AN-64-1 1977 43X Fundamentals of RF and Microwave Power Measurements  
AN-64-1A 1997 EPM-44X Fundamentals of RF and Microwave Power Measurements  
AN-64-2 1978 436A Extended Applications of Automatic Power Meters  
AN-64-3 1980 346B Accurate and Automatic Noise Figure Measurements  
AN-64-4A 1997 EPM-44X 4 Steps for Making Better Power Measurements  
AN-65 1965 690C-D Swept Frequency Techniques  
AN-66 1965 690 Swept SWR Tests in X-Band Coax  
AN-67 1968 1415A-1815B Cable Testing with Time Domain Reflectometry (With TDR Slide Rule)  
AN-68 1965 8614-8616B Accurate Receiver Sensitivity Measurements  
AN-69 1965 34XX ++ Which DC Voltmeter ?  
AN-70 1965 740-741B Precise DC Measurements  
AN-70 1969 740-741B Precise DC Measurements  
AN-71 1966 606-608 Advances in RF Measurements Using Modern Signal Generators 50Kc-480Mc  
AN-72 1966 5201L-5551A Integral Counting  
AN-73 1966 5201L-5551A Calibration of a Gamma Ray Spectrometer  
AN-75 1966 1415A Selected Articles on Time Domain Reflectometry Applications  
AN-76 1967 230A Using the 230A Power Amplifier  
AN-77-1 1967 8405A Transistor Parameter Measurements  
AN-77-2 1966 8405A Precision Frequency Comparison  
AN-77-3 1967 8405A Measurement of Complex Impedance 1-1000 MHz  
AN-77-4 1968 8405A Swept-Frequency Group Delay Measurements  
AN-78-1 1966 DYMEC-2801 Calibrating the Quartz Thermometer  
AN-78-2 1966 DYMEC-2801 Molecular Weight Determination with the Quartz Thermometer  
AN-78-3 1968 HP2801A Calorimetry and the Quartz Thermometer  
AN-78-4 1968 HP2801A A Glossary of Terms Pertaining to Temperature Measurements  
AN-78-5 1971 HP2801A Applications of the Quartz Crystal Thermometer  
AN-79 ? - Statistical Comparison of Digi  
AN-81 1967 203A Low Frequency Phase Shift Measurement Techniques  
AN-82 1966 - Power Supply/Amplifier Concepts and Modes of Operation  
AN-83 1966 - Increased Output Resistance for DC Regulated Power Supplies  
AN-84 1967 1416A Swept SWR Measurement in Coax  
AN-85 1966 5280A Using a Reversible Counter  
AN-86 1968 4800A-4815A Using the Vector Impedance Meters  
AN-87 1967 5210A FM and PM Measurements  
AN-88 1970 - Logic Symbology  
AN-89 1967 3960-3968 Magnetic Tape Recording Handbook  
AN-90 1967 HP-HARRISON DC Power Supply Handbook  
AN-90B 1978 HP-Only DC Power Supply Handbook  
AN-91 1968 8405A How Vector Measurements Expand Design Capabilities 1 to 1000 Mhz  
AN-92 ? 8410 Network Analysis at Microwave Frequencies  
AN-93 1969 540X Statistical Analysis of Waveforms and Digital Time-Waveform Measurements  
TIN-93 ? 5400A Electronic Application of the 5400A (Technical Information Note 93)  
AN-94 1968 - Connector Design Employing TDR Techniques  
AN-95 1968 8410 ++ S-Parameters… Circuit Analysis and Design  
AN-95A 1973 - Selected Reprints on S-Parameters… Circuit Analysis and Design  
AN-95-1 1967 - S-Parameter Techniques for Faster, More Accurate Network Design (Paper part of AN95)  
AN-96 1969 5105-5110B HP Direct-Type Frequency Synthesizers Theory, Performance and Use  
AN-98-1 ? 3722A Noise at Work - Model 3722A Aids Design of Process Control Systems  
AN-98-2 1969 H01-3722A Noise at Work - A Point by Point Correlator for the H01-3722A  
AN-99 1968 8541A 8541A Automatic Network Analyzer Measurement Capabilities  
AN-100 1968 - Acoustics Hanbook  
AN-101 1963 7560-7561A Multiplication and Division by Logarithms (HP-Moseley Division)  
AN-102 1963 7000-7100 Program Controllers (HP-Moseley Division)  
AN-105 1961 MOSELEY Polarography  
AN-105 1967 - Polarography (HP-Moseley Division)  
AN-106 1967 135-Moseley Electric Motor Testing Performance (HP-Moseley Division)  
AN-107 1965 - Guard Circuits (HP-Moseley Division)  
AN-108 1966 101-Moseley Hysteresis Curve Plotting (HP-Moseley Division)  
AN-109 1969 62XX Power Supply Overvoltage "CROWBARS"  
AN-110 1968 8410 Antenna/Radome Boresight Error Measurements  
AN-112-1 1968 675-676A Low-Frequency Network Analysis with the 675A/676A  
AN-112-2 1969 675-676A Using the 675A/676A Network Analyzer as an Educational Tool  
AN-114 1969 653A A2A Video Transmission System Alignment  
AN-115 1970 - Principles of Cathode-Ray Tubes, Phosphors, and High-Speed Oscillography  
AN-116 1969 5360A Precision Frequency Measurements  
AN-117-1 1970 8410 Microwave Network Analyzer Applications  
AN-117-2 1971 8410-11608A Stripline Component Measurements with the 8410A Network Analyzer  
AN-118 1970 1815A Dielectric Measurements with Time Domain Reflectometry  
AN-120 1969 5360A A New Technique for Pulsed RF Measurements  
AN-120-2 1970 5360A Measuring Phase with the 5360A Computing Counter  
AN-120-3 1970 5360A Non-Linear Systems Applications of the Computing Counter System  
AN-121-1 1970 8407A Network Analysis with the HP 8407A 0,1 - 110 MHz  
AN-121-2 1970 8407A Swept Impedance with the HP 8407A 0,1 - 110 MHz  
AN-122 1968 8551A EMI Measurement Procedure (according to MIL-STD 826A)  
AN-123 1970 - Floating Measurements and Guarding  
AN-124 1970 - True RMS Measurements  
AN-125 1970 3480B-2912A Data Acquisition - 3480B Digital Voltmeter - 2912A Scanner - 2547A Coupler  
AN-126 1970 3590A Theory and Applications of Wave Analyzers  
AN-127 1970 5480B Signal Averaging Enhancement of RF and Pulse Measurements  
AN-128 1970 6177B-618XB Applications of a DC Constant Current Source  
AN-129 ? - Logic Timing Measurements  
AN-130 1970 2570A Instrumentation Control with the HP Coupler/Controller  
AN-131 1971 2570-2575A Time-Sharing Based Instrumentation Terminal  
AN-132 1971 2570A-9100 Calculator Based Instrumentation Systems  
AN-133-1 1971 3480-180A Low Frequency Pulse Amplitude Measurements  
AN-133-2 1971 3485A A Guide to Remote Control of the 3485A Scanning Unit  
AN-133-3 1971 3480-2070A A Guide to Using Data Storage  
AN-133-4 1972 3480-2070A A Guide to Using Sample-and-Hold  
AN-134 1971 8556A-8552B Audio Frequency Measurements with the 8556A-8552B Spectrum Analyzer  
AN-135-1 1971 2116 ++ Computerized Data Acquisition Aids Final Testing  
AN-135-2 1971 2116 ++ High-Volume Production Testing  
AN-135-3 1971 2116 ++ Process Monitoring in Manufacturing  
AN-135-4 1971 2116 ++ Closed-Loop Production Testing  
AN-135-5 1971 2116 ++ A Mobile Process Control Laboratory  
AN-135-6 1971 2116 ++ Computer Analysis Aids Battery Testing  
AN-135-7 1971 2114-2116 ++ Data Acquisition and Analysis at Sea  
AN-135-8 1971 2116 ++ Minicomputer System Aids Busy Psychology Lab  
AN-135-9 1971 2116 ++ In-Flight Data Analysis Improves Airborne Research  
AN-135-10 1971 2114 ++ Computer Speeds Gas Turbine Combust Testing  
AN-135-11 1971 2116 ++ Stable Measurements on the High Seas  
AN-135-12 1971 2116 ++ Depot Testing of Avionic Modules  
AN-135-13 1973 2116 ++ Domestic Communications Satellites - A World's First  
AN-135-14 1972 2115 ++ Computerized Process Control Improves Sugar Refinery Production  
AN-135-15 1972 2116 ++ Minicomputer System Benefits Fuel Cell Technology  
AN-135-16 1972 2116 ++ Minicomputer Systems Aid Military Vehicle Testing  
AN-135-17 1972 2116 ++ Testing Ovonic Read-Mostly Memories  
AN-135-18 ? 2100A ++ An Automated Engine Laboratory in a Research Environment  
AN-135-19 1972 2116 ++ Testing Thick-Film Hybrid Circuits  
AN-135-21 1973 9500 ++ Viggen Avionics Support  
AN-135-22 1973 2100 ++ Real-Time Multiprogramming System Boosts Productivity for NCR  
AN-135-23 1973 9500 ++ Television Set Production Revolutionized by Automatic Alignment and Test  
AN-135-24 1973 2100A ++ Automated System Improves Spacecraft Testing  
AN-135-25 1973 2116 ++ Automation in Production Testing  
AN-136 1973 8445B-8555A Understanding and Operating the 8555A Spectrum Analyzer and 8445B Preselector  
AN-137 1971 4470A Probing Transistor Noise  
AN-138 1971 5401B Multichannel Analyzer Applications  
AN-139 1971 5586A Stabilizing Gamma-Ray Spectrometer Systems with the HP 5586A Spectrum Stabilizer  
AN-140-0 ? 5450 Fourier Analyzer Training Manual  
AN-140-1 1971 5450 Detecting Sources of Vibration and Noise Using HP Fourier Analyzers  
AN-140-2 1971 5450 Feedback Loop and Servomechanism Measurements Using HP Fourier Analyzers  
AN-140-3 1972 5451 Dynamic Testing of Mechanical Systems Using Impulse Testing Techniques  
AN-140-4 ? 5451 Digital Auto-Power Spectrum Measurements  
AN-140-5 1973 5451 Measurement of Transfer Functions with Wide Dynamic Range  
AN-140-6 1973 5451 Measurement of Machine Tool Vibration  
AN-140-7 1974 5451 Nuclear Power Plant Diagnostics Using Fourier Analysis Techniques  
AN-141 1971 5257A AM, FM Measurements with the Transfer Oscillator  
AN-142-XX 1968 8551 EMI Measurement Procedure (With 8551 Calibration Slide Rule)  
AN-142 1972 855X EMI Measurement Procedure  
AN-144 ? - Understanding Microwave Frequency Measurements  
AN-145-1 1971 2000C First Small Computer Solution to Text Editing Systems  
AN-145-2 1971 2114 Minicomputer Untangles Massive Inventory Problem in Heavy Industry  
AN-145-3 1971 2116B Flexible Computer-Controlled Laser System Revolutionizes Garment Industry  
AN-145-4 1971 2000C Inexpensive Time-Share System Solves Unique College Registration Problems  
AN-145-5 1971 2000C Computer System Helps Graduate Business School Teach Management Technology  
AN-145-6 1972 2000C Dedicated Time-Sharing Fills Multitude of Management Needs  
AN-145-7 1972 2000B Computer System Helps Motivate High School Students  
AN-145-8 1972 - Minicomputer Systems Improve Auto Maker's Production Efficiency  
AN-145-9 1972 2120A Low-Cost Batch System Streamlines Construction Projects  
AN-145-9 1973 2100 Microprogrammable Mini Expand University Computer Science Program  
AN-145-10 1972 2100A Rugged Minicomputer System Helps Ships Find the Sure, Safe Way  
AN-145-11 1972 2000X Time-Shared Systems Expand Scope of Education  
AN-145-12 1972 2000 Inexpensive Computer System "Does it All" for Small Manufacturer  
AN-145-13 1972 2000 Computer Systems Raise Student Achievement Levels  
AN-145-14 1972 2100 Small Computer System Pinpoints Suspects for Police Departments  
AN-145-15 1973 2000 Computer Systems Help University Provide Quality, Personalized Instruction  
AN-145-16 1973 2100 Small Computer System Keeps Apparel Industry in Style  
AN-145-17 1973 2000 Versatile Computer Systems Streamlining Hawaiian Industry  
AN-145-18 1973 2100 Small Computer System Keeps Meteorologists on Top of the Weather  
AN-145-19 1973 200X Small System Provides Bank with Versatile New Problem-Solver  
AN-145-20 1973 2100 Efficient Computer Systems Help Firm Maintain Competitive Edge  
AN-145-25 1974 200X Computer Network Connects Field Offices and Manufacturing Divisions  
AN-150 1974 855X Spectrum Analysis…. Spectrum Analyzer Basics  
AN-150A 1973 8558B Spectrum Analysis…. Using the 8558B Spectrum Analyzer  
AN-150B 1978 8557A-8558B Spectrum Analysis…. Using the 8557A and 8558B Spectrum Analyzers  
AN-150 1989 70XXX Spectrum Analysis…. Spectrum Analyzer Basics  
AN-150 2020 - Spectrum Analysis…. Spectrum Analyzer Basics yes
AN-150-1 1971 855X Spectrum Analysis Amplitude and Frequency Modulation  
AN-150-1 1989 - Spectrum Analysis Amplitude and Frequency Modulation  
AN-150-2 1971 855X Spectrum Analysis…. Pulsed RF (With Pulsed RF Calculator Slide Rule)  
AN-150-3 1974 855X-8444A Spectrum Analysis…. Swept Frequency Measurements and Selective Frequency Counting with a Tracking Generator  
AN-150-4 1974 855X Spectrum Analysis…. Noise Measurements  
AN-150-5 1973 855X Spectrum Analysis…. CRT Photography and X-Y Recording Techniques  
AN-150-6 1974 855X Spectrum Analysis…. CATV Proof of Performance  
AN-150-7 1975 855X Spectrum Analysis…. Signal Enhancement  
AN-150-8 1976 855X Spectrum Analysis…. Accuracy Improvement  
AN-150-9 1976 855X Spectrum Analysis…. Noise Figure Measurement  
AN-150-10 1976 855X Spectrum Analysis…. Field Strength Measurement  
AN-150-11 1976 855X Spectrum Analysis…. Distortion Measurement  
AN-150-12 1977 8565A-11517A Spectrum Analysis…. Using the HP 11517A External Mixer to 40 GHz  
AN-150-13 1978 8565A-8709A Stimulus-Response Measurements… Using the HP 8565A Spectrum Analyzer from 2-18 GHz  
AN-150-14 1978 855X Spectrum Analysis…. Using External Waveguide Mixers Above 40 GHz  
AN-150-15 2004 VSA Vector Signal Analysis Basics  
AN-151 1973 - Fundamentals of Air Navigational Systems  
AN-152 1972 - Probing in Perspective  
AN-153 1972 1415A-1815A Permeability, Permittivity and Conductivity Measurements with Time Domain Reflectometry  
AN-153-1 1997 815X The Basics of Fiber Optic Measurement and Calibration  
AN-154 1972 8410 ++ S-Parameter Design  
AN-154 1990 8510-875X S-Parameter Design  
AN-155-1 1976 8755 ++ Active Device Measurements with the HP 8755 Frequency Response Test Set  
AN-155-2 1977 8755 ++ 100 dB Dynamic Range Measurements Using the HP 8755 Frequency Response Test Set  
AN-155-3 1981 8755S Automating the HP 8755 Scalar Network Analyzer  
AN-156-1 ? 5526A Laser Measurement System - Remote Laser Interferometry  
AN-156-2 ? 5526A Laser Measurement System - Calibration of a Surface Plate  
AN-156-3 1972 5510A Laser Measurement System - Principles of Automatic Compensation  
AN-156-4 ? 5526A Laser Measurement System - Calibration of a Machine Tool  
AN-156-4 ? 5526A Système de Mesure à Laser - Etalonnage d'une Machine Outil (French Translation of AN 156-4)  
AN-156-5 1976 5526A Laser Measurement System - Measurement of Straightness of Travel  
AN-156-5 1979 5526A Système de Mesure à Laser - Mesure de la Rectitude d'un Déplacement (French Translation of AN 156-5)  
AN-157 1972 3570-3575 ++ Low Frequency Gain Phase Measurements  
AN-158 1973 34XX ++ Selecting the Right DVM  
AN-161-1 ? 9800-9830 Structural Engineering Applications - HP Series 9800 - The Name and Number That Save Time and Money  
AN-161-2 ? 9800-9830 Electrical Engineering - Transformer Engineers Save Time, Improve Accuracy with Calculator-Aided Design  
AN-162-1 ? 5326-5327 Time Interval Averaging  
AN-163-1 1973 105XX Techniques of Digital Troubleshooting  
AN-163-2 ? 161X-500X The IC Troubleshooters - New Techniques of Digital Troubleshooting  
AN-164-1 1974 8660A-B Programming the 8660A/B Synthesized Signal Generator (Standard BCD Interface)  
AN-164-2 1974 8660A-B Calculator Control of the 8660A/B/C Synthesized Signal Generator (Optional HP-IB Interface)  
AN-164-3 1975 8660 New Techniques for Analyzing Phase Locked Loops  
AN-164-4 1975 8660 Digital Phase Modulation (PSK) and Wideband FM… Using the 8660A/C Synthesized Signal Generator  
AN-166 ? 131X-1321A Large Screen Display Applications and Interfacing  
AN-166-2 ? 1304A Large Screen Display Applications and Interfacing (Supplement to AN 166)  
AN-167-1 ? 5000A The Logic Analyzer  
AN-167-2 ? 1601 Digital Triggering for Analog Measurements  
AN-167-3 ? 1601 Functional Digital Analysis  
AN-167-4 1975 1600A-1607A Engineering in the Data Domain Calls for a New Kind of Digital Instruments (Reprint from Electronics Magazine May 1/75)  
AN-167-5 1975 1600A-1607A Troubleshooting in the Data Domain is Simplified by Logic Analyzers (Reprint from Electronics Magazine May 15/75)  
AN-167-6 ? 1600A Mapping a Dynamic Display of Digital System Operation  
AN-167-7 ? 1600A Supplementary Data from Map Displays Without Changing Probes  
AN-167-8 ? 1620A-7900A Stable Displays of Disc System Waveforms Synchronized to Record Address  
AN-167-9 ? 1600A-1607A Functional Analysis of the Motorola M6800 Microprocessor System  
AN-167-10 ? 1620A Using the 1620A for Serial Pattern Recognition  
AN-167-11 ? 1600A-1607A Functional Analysis of Intel 8008 Microprocessor Systems  
AN-167-12 ? 1600A-1607A Functional Analysis of Fairchild F8 Microprocessor Systems  
AN-167-12A ? 1600A-1607A Functional Analysis of Mostek F8 Microprocessor Systems  
AN-167-13 1975 1740S The Role of Logic State Analyzers in Microprocessor Based Designs  
AN-167-14 ? 1600A-1607A Functional Analysis of 8080 Microprocessor Systems  
AN-167-15 ? 1600A-1607A Functional Analysis of Intel 4004 Microprocessor Systems  
AN-167-16 ? 1600A-1607A Functional Analysis of Intel 4040 Microprocessor Systems  
AN-167-17 ? 1600A-1607A Functional Analysis of National IMP Microprocessor Systems  
AN-167-18 ? 1600A-1607A Functional Analysis of National Semiconductor SC/MP Microprocessor System  
AN-167-19 1976 1600A-1607A Systematic "turn-on" of Microprocessor Systems Using Logic State Analyzers  
AN-170-1 1988 8640A-B HP 8640A/B Signal Generator Output Level Accuracy  
AN-170-2 1975 8640A-B HP 8640A/B Signal Generator Third-Order Intermodulation Characteristics  
AN-171-1 1974 8640-8405A Crystal Testing with the HP 8640A/B and HP 8405A  
AN-171-2 1974 8640B Extending the 8640B Frequency Down to DC  
AN-172 1970? - The Fundamentals of Electronic Frequency Counters  
AN-173 1974 5340 ++ Recent Advances in Pulsed RF and Microwave Frequency Measurements  
AN-173-1 1975 5345A Dynamic Measurement of Microwave Voltage Controlled Oscillators with the 5345A Electronic Counter  
AN-174-0 1974 5345A Index to the AN 174 Application Notes Series  
AN-174-1 ? 5345A Measuring the Transfer Characteristic of a Voltage Controlled Oscillator  
AN-174-2 ? 5345A Measuring Differential Nonlinearity of a Voltage Controlled Oscillator  
AN-174-3 ? 5345A Measuring Integral Nonlinearity of a Voltage Controlled Oscillator  
AN-174-4 ? 5345A Measuring Dual VCO Tracking Error  
AN-174-5 ? 5345A Determining Probability Densities (Histograms) with the 5345 Electronic Counter  
AN-174-6 ? 5345A Measuring the Stability of a Frequency Source  
AN-174-7 1974 5345A Measuring Fractional Frequency Deviation (Short Term Stability of Oscillators)  
AN-174-8 ? 5345A Measuring FM Peak-to-Peak Deviation  
AN-174-9 1974 5345A Making Automatic Phase Measurements with the 5345A Electronic Counter  
AN-174-10 1974 5345A Measuring Electrical Length (Delay) of Cables  
AN-174-11 1974 5345A-59308A Measuring Warm-Up Characteristics and Aging Rates of Crystal Oscillators  
AN-174-12 1974 5345A-59308A Measuring Frequency Sweep Linearity of Sweep Generators  
AN-174-13 1974 5345A-59308A Measuring the Tuning Step Transient Response of VCO's to 18 GHz  
AN-174-14 1987 5345A Radar System Characterization and Testing Using the HP 5345A Electronic Counter  
AN-175-1 1974 MLA Microwave Link Measurement - Differential Phase & Gain at Work  
AN-176-13 ? - Reactant Gas Selection in Chemical Ionization Mass Spectrometry  
AN-176-16 ? - Reactant Gas Selection in Chemical Ionization Mass Spectrometry - Part II  
AN-181-1 1974 5340A Measuring Linearity of VCO's from 10 Hz to 23 GHz  
AN-181-2 1974 5300B Data Acquisition with the 5300B Measuring System  
AN-181-2 1986 535X Voltage-Contolled Oscillators Characterization  
AN-183 1978 8755 ++ High Frequency Swept Measurements  
AN-185 1974 1722A Waveform Parameter Measurements Using the Microprocessor Controlled Oscilloscope Model 1722A  
AN-185-2 ? 1722A Transmission Line Matching and Length Measurements Using the Microprocessor Controlled Oscilloscope Model 1722A  
AN-185-3 ? 1722A Percent Amplitude Modulation Measurement in the Time Domain  
AN-185-4 ? 1722A Elimination of Computation on Analog Measurements by Using the Direct Reading Oscilloscope Model 1722A  
AN-186 ? 1722A Dual-Delayed Sweep for Precise Time Interval Measurements  
AN-187-2 1975 8620-8709 ++ Configuration of a 2-18 GHz Synthesized Frequency Source Using the 8620C Sweep Oscillator  
AN-187-3 1976 8755-8410 ++ Three HP-IB Configurations for Making Microwave Scalar Measurements  
AN-187-4 1976 8620-8709 Configuration for a Two-Tone Sweeping Generator  
AN-187-5 1976 8620-5340 Calculator Control of the 8620C Sweep Oscillator Using the Hewlett-Packard Interface Bus  
AN-187-6 1979 8620-8709 ++ The Frequency Performance of the 8620C Sweep Oscillator Under Remote Programming  
AN-188 ? 3050B Thermocouple Measurements with the 3050B  
AN-190 1975 8620-8709 ++ 40 GHz Frequency Measurement with Standard HP Instruments  
AN-191 1976 534X-5363A Precision Time Interval Measurements Using an Electronic Counter  
AN-191-1 1977 5359A-5363A Automatic Zero Calibration of the 5359A Time Synthesizer at a Designated Remote Location  
AN-191-2 1977 5359A Determining Digital Circuit Timing Tolerance to Optimize Adjustment or Design  
AN-191-3 1977 5370A Precision Time Interval Measurements in Radar Applications  
AN-191-4 1978 5370A Using the 5370A Universal Time Interval Counter to Characterize Pulse Width, Repetition Rate and Jitter  
AN-191-5 1980 5370A-5363B Measurement of Propagation Delays Using the 5370A Time Interval Counter and 5363B Time Interval Probes  
AN-191-6 1980 5370A-5363B Precise Cable Length and Matching Measurements Using the 5370A Time Interval Counter and 5363B Time Interval Probes  
AN-191-7 1987 5370B HP 5370B Universal Time Interval Counter - High-Speed Timing Acquisition and Statistical Jitter Analysis  
AN-192 1975 358X-855X Using a Narrow Band Analyzer for Characterizing Audio Products  
AN-195 1975 8011-8015 Pulse Generator Techniques in CMOS Applications  
AN-196 1975 436A Automated Measurements Using the 436A Power Meter  
AN-196-1 1979 432C Automated Power Measurements Using the 432C Power Meter - Including Waveguide and Fiber Optic Measurements  
AN-197-1 1975 5501A Laser Interferometers for Position Feedback  
AN-197-2 ? 5501A Laser and Optics  
AN-198 1975 1230A Event-Related Triggering a Clear Solution for Digital Signals  
AN-199 ? 133X Small Screen Displays Medical Diagnostic System Applications and Interfacing  
AN-200 1978 53XX Fundamentals of the Electronic Counters  
AN-200 1997 53XX Fundamentals of the Electronic Counters  
AN-200-1 1977 53XX Fundamentals of Microwave Electronic Counters  
AN-200-1 1997 53XX Fundamentals of Microwave Electronic Counters  
AN-200-2 ? - Fundamentals of Quartz Oscillators  
AN-200-3 ? 53XX Fundamentals of Time Interval Measurements  
AN-200-4 1997 53XX Understanding Frequency Counter Specifications  
AN-201-1 1976 2108A ++ Automatic Q-A Evaluation of Precision Resistors  
AN-201-2 1976 2108A ++ Measuring Differential Non-Linearity of a Voltage-Controlled Oscillator  
AN-201-3 1976 2113A ++ A Multiple Station Electronic Test System  
AN-201-4 1977 HP1000 ++ Performance Evaluation of HP-IB Using RTE Operating Systems  
AN-201-5 1977 HP1000 ++ The HP-IB Link: Control of Distributed HP-IB Devices  
AN-201-6 1980 HP1000-9825 Computer Communications: HP 9825 - HP 1000  
AN-201-7 1978 HP1000-3455 High-Performance Software for the HP 3455A/3495A Subsystem  
AN-201-8 1979 HP1000 ++ The Use of Device Subroutines with the HP 1000 Computers  
AN-201-9 ? HP1000 ++ ?  
AN-201-10 ? HP1000 ++ Computer communications HP 98355/9845-HP 1000  
AN-202-01 1976 2100S-7260A Optical Mark Reader Substantially Increase Productivity  
AN-202-03 1976 7261A Distributed Hewlett-Packard Optical Mark Readers Provide Easy Remote Data Collection  
AN-204-1 1977 3050B Automatic Accelerometer Calibration Helps Assure Air Dropped Cargo Survivability  
AN-204-2 1977 3050 Energy Conservation in a Restaurant - Measurement / Computation Using Hewlett-Packard's Data Aquisition System  
AN-205-1 1977 3042A Low Frequency Amplitude Considerations of 3042A System  
AN-205-2 1979 3042A Sonar Transducer Calibration - Measurement and Computation with Hewlett-Packard's 3042A Automatic Network Analyzer System  
AN-206-1 1977 3045A Measuring Wideband Noise with the HP 3045A Automatic Spectrum Analyzer  
AN-207 1976 3045A Understanding and Measuring Phase Noise in the Frequency Domain  
AN-210-1 ? DTS-70 Digital Test System - Modeling and Simulation for Digital Testing  
AN-210-4 ? DTS-70 Digital Test System - Designing Digital Circuits for Testability  
AN-212-1 1977 HP1000 Building an Inventory Control Data Base  
AN-212-2 1977 HP1000 Building an Order Processing Data Base  
AN-214-1 1977 704X Recording with Input Noise Present  
AN-214-2 1977 704X X-Y Recorder Dynamic Response  
AN-214-3 1977 704X X-Y Recorder Input Connection Configuration and Input Noise  
AN-214-4 1977 704X High-Sensitivity X-Y Recorder Has Few Input Restrictions  
AN-216 ? 3570A-3571A A Guide to the Use of HP3570A and 3571A Analyzers  
AN-218-1 1977 8671A-8672A Applications & Performance of the 8671A and 8672A Microwave Synthesizers  
AN-218-2 1977 8671A-8672A Obtaining Millihertz Resolution from the 8671A & 8672A  
AN-218-3 1978 8660-8672A A 1 MHz to 18 GHz Signal Generator with 1, 2, or 3 Hz Resolution  
AN-218-4 1979 8672-938-940A Synthesized Signals from 18 to 37,2 GHz Using the 8672A  
AN-218-5 1981 8672A-11720A Obtaining Leveled Pulse-Modulated Microwave Signals from the HP 8672A  
AN-219 1977 8505A HP 8505A RF Network Analyzer Basic Measurements  
AN-220 1977 8565A Operating the HP 8565A Spectrum Analyzer  
AN-221 1977 8410B-9825A Semi-Automatic Measurements Using the 8410B Microwave Network Analyzer and the 9825A Desk-Top Computer  
AN-221A 1980 8410B Automating the HP 8410B Microwave Network Analyzer  
AN-222 1977 5004A A Designer's Guide to Signature Analysis  
AN-222-1 ? 3060A Implementing Signature Analysis for Production Testing with the HP 3060A Board Test System  
AN-222-2 1979 5004A Application Articles on Signature Analysis  
AN-222-3 1980 5004X A Manager's Guide to Signature Analysis  
AN-222-4 1977 2240A An Intelligent Analog/Digital Subsystem to Simplify Product Test and Equipment Control - Signal Conditioning: HP 22914A Card  
AN-222-5 1982 500X-HP85 Increasing Productivity in Manufacturing and Service with a Logic Troubleshooting System  
AN-222-6 1983 5006A Troubleshooting with Composite Signatures  
AN-222-7 1982   ?  
AN-222-8 1982   ?  
AN-222-9 1982   ?  
AN-222-10 1980   A Signature Analysis Case Study of a Z80-Based personal Computer  
AN-222-11 1981 500X A Signature Analysis Case Study of a 6800-Based Display Terminal  
AN-222-12 1982   A Signature Analysis Based Test System for ECL Logic  
AN-223 ? 1600A-1741A Oscilloscope Measurements in Digital Systems  
AN-224-1 1977 2240A An Intelligent Analog/Digital Subsystem to Simplify Product Test and Equipment Control - Measurement and Control Examples  
AN-224-2 1978 2240A measurement & control processor - HP 22914A breadboard card  
AN-225 1978 5390A Measuring Phase Spectral Density of Synthesized Signal Sources Exhibiting F0 and F-1 Noise with the 5390A Freq. Stability Analyzer  
AN-225-1 ? 5390A Measurement Considerations when Using the 5390A Option 010  
AN-226 1977 9850A-9825A Automatic Transceiver Testing with the 8950A  
AN-227 1977 8016A Word Generator Techniques in Multi-Channel Applications  
AN-229-1 1977 7221A HP-Plot/21 Software Conversion Guide  
AN-231-1 1979 3779 Single Channel Codec Testing>/a>  
AN-231-2 1983 3779 Codec Testing with the HP 3779C/D Primary Multiplex Analyzer  
AN-231-3 1984 3779 Making Telecommunications Measurements in Complex Impedance  
AN-233-1 1981 1610A Funtional Analysis of Signetics 2650 Microprocessor Systems Using the 1610A  
AN-233-2 ? 1610A Funtional Analysis of TMS 9900 Microprocessor Systems Using the 1610A  
AN-233-3 ? 1610A Funtional Analysis of Z80 Microprocessor Systems Using the 1610A  
AN-233-4 ? 1610A Funtional Analysis of 8080 Microprocessor Systems Using the 1610A  
AN-233-5 ? 1610A Funtional Analysis of 6800 Microprocessor Systems Using the 1610A  
AN-233-6 1980 1610A-B Functional Analysis of HP-1000 L-SeriesComputer Using the 1610A/B  
AN-233-7 1980 1610A-B Computer Performance Analysis Using the 1610A/B  
AN-234-1 1977 8568A 8568A Spectrum Analyzer Operation  
AN-235 ? 654A-3320C An Introduction to Balanced Circuits and Impedance Matching  
AN-236-1 1977 - A "MAKE" or "BUY" Analysis for Power Supplies  
AN-236-2 1979 - Two Power Supply Redundancy Schemes  
AN-236-4 1981 65000 EMI/RFI and HP 65000A Series Power Supplies - Meeting FCC and VDE Requirements for Computing Equipment  
AN-238 1980 4140B Semiconductor Measurements with the HP 4140B Picoammeter / DC Voltage Source  
AN-238-1 1981 4140B-HP85 Ultra Low Current Semiconductor DC Parameter Measurement System using HP 4140B  
AN-240-0 1977 5420A Digital signal analysis - time & freq domain measurements  
AN-240-1 ? 5420A Digital Signal Analysis - Feedback Control System Measurements  
AN-240-2 ? 5420A Improving the Accuracy of Structural Response Measurements  
AN-243 1994 3582A The Fundamentals of Signal Analysis  
AN-243-1 1983 358X Effective Machinery Maintenance Using Vibration Analysis  
AN-243-1 1994 3562 Effective Machinery Measurements Using Dynamic Signal Analyzers  
AN-243-2 1991 3562 Control System Development Using Dynamic Signal Analyzers  
AN-243-2 1987 3562 Measuring Switching Power Supply Stability with the HP 3562A (Supplement of AN 243-2)  
AN-243-2 1984 3562 Measuring Switching Power Supply Stability with the HP 3562A (Supplement of AN 243-2)  
AN-243-3 1992 3562 The Fundamentals of Modal Testing  
AN-243-4 1989 3562 Fundamentals of the Z-Domain and Mixed Analog/Digital Measurements  
AN-243-5 1992 - Control System Loop Gain Measurements  
AN-243-6 1992 3562-3577 Control System Measurement Fundamentals Using Dynamic Signal Analyzers and Accessories  
AN-243-7 1995 358X Bearing Runout Measurements  
AN-245-1 ? 3582A Signal Averaging with the 3582A Spectrum Analyzer  
AN-245-2 ? 3582A Measuring the Coherence Function with the 3582A Spectrum Analyzer  
AN-245-3 ? 3582A Third Octave Analysis with the 3582A Spectrum Analyzer  
AN-245-4 1979 3582A Accessing the 3582A Memory with HP-IB  
AN-245-5 1979 3582A Log Sweep with the 3582A Spectrum Analyzer  
AN-246 1978 3585A Using the HP 3585A Spectrum Analyzer with the HP 9825A Computing Controller  
AN-246-1 1979 3585A Optimizing the Dynamic Range of the HP 3585A Spectrum Analyzer  
AN-246-2 1981 3585A Measuring Phase Noise with the HP 3585A Spectrum Analyzer  
AN-250-1 1978 - HP-IB / Power Supply Interface Guide  
AN-250-2 1979 - Battery Charging / Discharging (Lab & Industrial Power Sources)  
AN-260-1 ? 1615A Understanding Hewlett-Packard's Model 1615A Logic Analyzer  
AN-262 1978 1725A Eliminating Time-Base Errors from Oscilloscope Measurements  
AN-263 ? 10023A Thermal Measurements of Electronic Components Using the Hewlett-Packard Temperature Probe  
AN-270-1 1978 8568A An Example of Automatic Measurement of Conducted EMI with the HP 8568A Spectrum Analyzer  
AN-270-2 1980 8568A Automated Noise Sideband Measurements Using the HP 8568A Spectrum Analyzer  
AN-271-1 1978 1350A-9825A Adding Soft Copy Graphics to 9825A Based HP-IB Systems Using the Model 1350A Graphic Translator  
AN-272 1978 1743A Precise Time Interval Measurements Using the Crystal Controlled Time Base Model 1743A Oscilloscope  
AN-275 1979 1640A Symptomatic Troubleshooting of Computer Networks with the HP 1640A  
AN-275-1 1979 1640A Using the HP 1640A Serial Data Analyzer with the Epitape Recorder  
AN-275-2 1979 1640A Using the HP 1640A Serial Data Analyzer with the Spectron T-511 Tape Unit  
AN-276 1980 133X Continuous Tone Imaging with Cathode-Ray Tube Displays  
AN-280-1 ? 1602A Making Complex Measurements with the HP Model 1602A Logic State Analyzer  
AN-280-2 1978 1602A Monitoring the IEEE-488 Bus with the 1602A Logic State Analyzer  
AN-280-3 1978 1602A The 1602A Logic State Analyzer As An Automatic Test Instrument  
AN-280-4 1979 1602A Using 1602A's for Measurements on Wide Buses in Manual and Automatic Modes  
AN-281-1 1978 HP1000 A Way to Get Higher Performance from HP 1000 Computers  
AN-281-2 1978 HP1000 HP 1000 M-Series to E-Series Microprogram Conversion  
AN-281-3 1978 HP1000 Using the HP 1000 E-Series Microprogrammable Processor Port  
AN-282-1 1978 6940B 6940B Multiprogrammer System Throughput Analysis for Multiprogrammer Systems Using the 9825A Desktop Computer  
AN-283-1 1981 8662A Applications and Measurements of Low Phase Noise Signals Using the 8662A Synthesized Signal Generator  
AN-283-2 1979 11721A External Frequency Doubling of the 8662A Synthesized Signal Generator  
AN-283-3 1986 8662A-8663A Low Phase Noise Applications of the HP 8662A and 8663A Synthesized Signal Generators  
AN-285 1979 4904A-4930A Successful Buried Cable Fault Locating  
AN-286-1 1980 8901A Applications and Operation of the 8901A Modulation Analyzer  
AN-286-2 1981 8901A Accurate Mixer/Amplifier Compression Measurement Using the 8901A Modulation Analyzer  
AN-287-1 ? 5328A Waveform Analysis Using the 5328A Universal Frequency Counter  
AN-287-2 ? 5345A-5359A Frequency Profile Using an HP 5345A Electronic Frequency Counter and an HP 5359A Time Synthesizer  
AN-287-3 ? 5370A-5359A Frequency Profile Using an HP 5370A Universal Time Interval Counter and an HP 5359A Time Synthesizer  
AN-289 1979 8165A A Stimulus for Automatic Test  
AN-290 1980 - Practical Temperature Measurements  
AN-290 1997 - Practical Temperature Measurements  
AN-290-1 1987 - Practical Strain Gage Measurements  
AN-290-2 1982 3497A Using the HP 3497A to Control Industrial Wastewater Treatment  
AN-291-1 1979 5345A-5355A Application Guide to the 5355/56 Automatic Frequency Converter  
AN-292 1979 1610A-HP1000 Minicomputer Analysis Techniques Using Logic Analyzers  
AN-292-1 1981 1610A-1615A Funtional Analysis of the IEEE-488 Interface Bus  
AN-293 ? 1611A Funtional Analysis of Microprocessor Systems with the 1611A Option 001 General Purpose Module  
AN-294 1979 8754A-9825A Semi-Automatic R.F. Network Measurements Using the HP 8754A Network Analyzer and the HP 9825A Desktop Computer  
AN-296 1980 8170A An Apllications Guide for the 8170A Logic Pattern Generator  
AN-296-1 1980 8170A 8170A Logic Pattern Generator Simulates Multi-Channel Serial Data  
AN-297-1 1981 8161A 8161A Programmable Pulse Generator  
AN-297-2 1981 8161A-5370A 8161A Automated Reverse Recovery Time Measurements of Diodes  
AN-298-1 1980 64000 RS-232-C Communications with HP 64000 Logic Development System  
AN-298-2 1981 64000 Software Project Management with HP 64000 Logic Development System  
AN-298-3 1981 64000 Enhancing 64000 System Assemblers with Model 64851A User Definable Assembler  
AN-298-4 1981 64000 HP 64000 Logic Development System Microassemblers for Bit-slice Processors  
AN-298-5 1980 64000 Using HP 64000 with Logic Development System Computer Networks  
AN-299 1980 1336A Interfacing HP's Model 1336A Display to High-Resolution Imaging Systems  
AN-300 1980 89XX-HP85 High Performance Semi-Automatic Transceiver Testing  
AN-301-1 1980 10544-10811 Low Noise Division of 10 MHz Oscillators  
AN-302-1 1980 4191A Direct Radio Frequency Impedance Measurements Using the 4191A RF Impedance Analyzer  
AN-302-2 1981 4191A Impedance Characterization of High Q Devices from 1MHz to 1000MHz with 1Hz Resolution Using the 4191A RF Impedance Analyzer  
AN-308-1 1980 3060A Dynamic Digital Board Testing with the HP Model 3060A Option 100  
AN-309-1 1981 3060A Static Digital Testing Using the HP 3060A Board Test System  
AN-309-2 1981 3060A Networking your Computer to the HP 3060A Board Test System  
AN-311 1981 - Economics of IC Testing at Incoming Inspection  
AN-312-1 1981 8350-8709 Configuration of a Two-Tone Sweeping Generator 8350A/8620C Sweep Oscillators  
AN-313-1 ? 5180A Troubleshooting Microprocessor-Based Systems Using the 5180A Waveform Recorder and a Logic Analyzer  
AN-313-2 ? 5180A-85XX Teaming Up a 5180A Waveform Recorder and a Spectrum Analyzer for New Time-Domain Measurement Capabilities  
AN-313-3 ? 5180A Using the 5180A Waveform Recorder to Measure Microwave VCO Settling Time and Post Tuning Drift  
AN-313-4 ? 5180A-5359A Extending Frequency Range and Increasing Effective Sample Rate on the 5180A Waveform Recorder  
AN-313-5 ? 5180A Power Supply Testing with the 5180A Waveform Recorder  
AN-313-6 ? 5180A-5359A Recording Sonar and Other Signals Using the 5180A's Toggle Mode  
AN-313-7 ? 5180A-3325A Interconnecting Two or More 5180A Waveform Recorders to Obtain Multiple Input Channels  
AN-313-8 1983 5180A-9826 Using the Direct Memory Access Capability of the 5180A Waveform Recorder with the 9826 Desktop Computer  
AN-313-9 ? 5180A-8112A Using the 5180A Waveform Recorder to Evaluate Floppy Disc Media and Drive Electronics  
AN-313-10 1988 5185A-5185T HP 5181A Waveform Recorder - HP 5185T Digitizing Oscilloscope - Radar System Characterization and Testing  
AN-313-11 1988 5185T Using Digital Filtering Techniques to Improve Analog-to-Digital Converter Measurements  
AN-314 1981 1741A Variable-Persistence Aids Signal Display (Reprint from EDN Magazine)  
AN-314-1 1986 8770S Receiver Testing with the 8770S Arbitrary Waveform Synthesizer System  
AN-314-2 1986 8770S Synthesizing Magnetic Disc Read and Servo Signals with the HP 8770S Arbitrary Waveform Synthesizer System  
AN-314-3 1986 8770S Television Signal Simulation with the HP 8770S Arbitrary Waveform Synthesizer System  
AN-314-4 1987 8770A-8780A Exceptionally-Complex Signal Simulation for Multi-Signal Environments in Radar/EW Test  
AN-314-5 1989 8780A-8791 A Guide to Microwave Upconversion  
AN-315 1985 4145A DC Parametric Analysis of Semiconductor Devices  
AN-315 1992 4145B Practical Applications of the HP 4145B Semiconductor Parameter Analyzer - DC Parametric Analysis of Semiconductor Devices  
AN-316 1983 - Introduction to Computer Aided Test  
AN-316-1 1982 6942A Buffered Analog-to-Digital Conversion with the 6942A Multiprogrammer  
AN-316-2 ? 6942A Waveform digitizaton with the 6942A multiprogrammer  
AN-316-3 1982 6942A High Speed FET Scanning with the 6942A Multiprogrammer  
AN-316-4 1982 6942A Power Supply Programming using the 6942A Multiprogrammer  
AN-317 1982 4193A-9845B Practical Design and Evaluation of High Frequency Circuits Using the HP 4193A Vector Impedance Meter  
AN-318-1 1982 - The Benefits of P/AR  
AN-319 1982 818X Parametric Characterization of Digital Circuits Up to 50 MHz  
AN-320 1982 - Automatic V-Curve Analysis of Microwave Radio Systems  
AN-321 ? - High Speed Sorting of varactor Diodes  
AN-322 1983 4280A Analysis of Semiconductor Capacitance Characteristics Using the HP 4280A 1MHz C Meter / C-V Plotter  
AN-323 1983 3746A Detection of High Level Signals in FDM Networks  
AN-324-1 1983 445XX Understanding Your Bed-of-Nails Test Fixture  
AN-325-1 ? - Calibration of a Surface Plate  
AN-325-2 ? 5528A Machine Tool Calibration - Laser Measurement System 5528A - HP85  
AN-325-10 1989 - Submicron Positioning  
AN-325-11 1989 - Disk Drive Servo-Track Writing with Laser Interferometers  
AN-325-12 1990 5517B-10705A Non-Contact Measurements with Laser Interferometers  
AN-325-20 1993 - Using Material Temperature Compensation to Improve Laser Interferometer Meas. Accuracy  
AN-326 1986 - Principles of Microwave Connector Care (For Higher Reliability and Better Measurements)  
AN-328-1 1983 3488A ++ Practical Test System Signal Switching  
AN-329 1983 86XX-83XX Performance Characteristics of HP Microwave Signal Sources - A Comparison  
AN-329 1986 86XX-83XX Microwave Signal Sources Spectral Purity Characteristics of HP Microwave Signal Sources  
AN-330-1 1985 8566-9836 Automatic MIL-STD EMI Testing Using the HP 85864A/B EMI Measurement Software  
AN-331-1 1986 8566-85650A Automatic CISPR EMI Testing For Conductef Emissions Using the HP 85864A/B EMI Measurement Software  
AN-332 1984 11713A-333XX Microwave Switching From SPDT to Full Access Matrix  
AN-332-1 1987 11713A-333XX Novel combinations of microwave switches and step attenuators for programming applications  
AN-333 1984 3054A Monitoring of a Solar Collector and Heat Reclamation Heating System  
AN-334 1984 4063A Automation of Semiconductor Parameter Analysis - Practical Applications of the HP 4063A Semiconductor Parameter Analysis System  
AN-335 1984 4937A Return Loss and the HP 4937A  
AN-336 1985 - An Introduction to Signaling  
AN-339 1985 4194A Parametric Analysis for Electronic Components and Circuit Evaluation Using the 4194A Impedance / Gain-Phase Analyzer  
AN-339-1 1985 4194A Impedance Characterisation of Resonators Using the 4194A Impedance / Gain-Phase Analyzer  
AN-339-2 1986 4194A Characteristic Impedance Measurement of PC Board Circuit Patterns - HP 4194A Application Information  
AN-339-3 1986 4194A Crosstalk and Impedance Measurements of PC Board Patterns - HP 4194A Application Information  
AN-339-4 1986 4194A Measuring the Characteristic Impedance of Balanced Cables - HP 4194A Application Information  
AN-339-5 1986 4194A Multi-Frequency C-V Measurements and Doping Profile Analysis of Semiconductors - HP 4194A Application Information  
AN-339-6 ? 4194A Static Head Testing of Disk Drives - HP 4194A Application Information  
AN-339-7 1987 4194A Efficient Evaluation of LISNs and Voltage Probes for EMI Tests - HP 4194A Impedance / Gain-Phase Analyzer  
AN-339-8 1987 4194A Constant Current Measurements Using the HP 4194A - HP 4194A Impedance / Gain-Phase Analyzer  
AN-339-9 1987 4194A Negative Impedance Measurements of Crystal Oscillators - HP 4194A Impedance / Gain-Phase Analyzer  
AN-339-10 1987 4194A Input / Output and Reflection Coefficient Measurements - HP 4194A Impedance / Gain-Phase Analyzer  
AN-339-11 1987 4194A Filter Test for Production and Incoming Inspection - HP 4194A Impedance / Gain-Phase Analyzer  
AN-339-13 1987 4194A Measuring the dielectric Constant of Solid Materials - HP 4194A Impedance / Gain-Phase Analyzer  
AN-339-14 1988 4194A Testing Switching Power Supplies Using the HP 4194A  
AN-339-20 1987 414X Role of DC Parametric Test in High Speed Digital and Microwave Semiconductor Component Manufacturing  
AN-340-1 1985 5183T Using the HP 5183T to characterize sonar transducers and systems  
AN-340-1 1990 - Reducing Fixture-Induced Test Failures  
AN-341-1 ? 1630G-8175A Testing a Complex LSI / VLSI IC with a Low-Cost Measurement Set-UP  
AN-341-2 1988 8175A Simulating Sensor Signals - Calibrating and Testing an IR Detecting System with the HP 8175A  
AN-343-1 1986 8780A-8980A Vector Modulation Measurements - Measurement Applications for Digital Microwave Radio  
AN-343-2 1988 8780A-8981A Dynamic Component Test Using Vector Modulation Analysis  
AN-343-3 1986 8780A-8980A Vector Modulation Measurements - Coherent Pulsed Tests of Radar and Electronic Warfare Systems  
AN-343-4 1987 8980A Measuring Demodulator Image Rejection Using the HP 8980A Vector Analyzer  
AN-343-5 1988 8780A-8770A Calibrated Microwave System for Complex Arbitrary Signal Simulation Using HP 8780A and HP 8770A Arbitrary Waveform Synthesizer  
AN-343-6 1989 878X-3708A Testing Digital Microwave Receivers Using a Calibrated Source  
AN-344 1986 54100A-D Bandwidth and Sampling Rate in Digitizing Oscilloscopes  
AN-345-1 1986 8757A ++ Amplifier Measurements Using the Scalar Network Analyzer  
AN-345-1 2001 8757A ++ Microwave Component Measurements - Amplifier Measurements Using the Scalar Network Analyzer  
AN-345-2 1987 8757A ++ Mixer Measurements Using the Scalar Network Analyzer  
AN-346 1986 41XX-42XX A Guideline for Designing External DC Bias Circuits for the HP 4192A, 4194A, 4274A, 4275A, 4276A, 4277A  
AN-346-2 1992 4194A-4195A Balanced Circuit Measurement wth an Impedance Meter / LCR Meter / Network Analyzer  
AN-346-3 1992 4285A Effective Impedance Measurement Using OPEN / SHORT / LOAD Correction  
AN-346-4 1999 42XX 8 Hints for Successful Impedance Measurements  
AN-348 1986 - Voltage and Time Resolution in Digitizing Oscilloscopes  
AN-349 1986 - PC Instruments Applications Handbook - Explore Ways to Improve Your Test and Measurement Productivity  
AN-351 1987 8753A Characterization of High-Speed Optical Components with an RF Network Analyzer  
AN-355A 1992 37XX Digital Radio Theory and Measurements  
AN-355-1 1992 37XX-8590A A Description of the Wide Range of Test Solutions Available From HP for Digital Radio Test  
AN-356 1987 4142B-S300 HP 4142B Modular DC Source / Monitor Practical Applications - High Speed DC Characterisation of Semiconductor Devices Sub pA to 1A  
AN-356-1 1988 4142B-S300 HP 4142B Modular DC Source / Monitor Practical Applications - Techniques and Applications for High Throughput and Stable Characterization  
AN-357-3 1988 4195A Advanced Filter Evaluation and Limit Testing with HP 4195A Network / Spectrum Analyzer  
AN-357-4 1989 4195A Testing Magnetic Disk Read Circuits Using the HP 4195A  
AN-358-1 1987 5371A HP 5371A Frequency and Time Interval Analyzer - Characterization of Frequency-Agile Signal Sources  
AN-358-2 1987 5371A HP 5371A Frequency and Time Interval Analyzer - Jitter and Wander Analysis in Digital Communications  
AN-358-3 1988 5371A HP 5371A Frequency and Time Interval Analyzer - Time Domain Characterization of Magnetic Disk Drives  
AN-358-4 1989 5372A HP 5372A Frequency and Time Interval Analyzer - Pre-Trigger Simplifies VCO Step Response Measurements  
AN-358-5 1989 5372A HP 5372A Frequency and Time Interval Analyzer - Clock Rate Independent Jitter Measurements for Digital Communications Systems  
AN-358-5 1990 5372A Mesure de Gigue Indépendante de la Vitesse d'Horloge pour les Systèmes de Transmission Numériques (French Translation of AN 358-5)  
AN-358-6 1989 5372A HP 5372A Frequency and Time Interval Analyzer - Characterizing Transient Timing Errors in Disk and Tape Drives  
AN-358-7 1989 5372A HP 5372A Frequency and Time Interval Analyzer - Analysing Phase-Locked Loop Transients in the Modulation Domain  
AN-358-8 1989 5372A HP 5372A Frequency and Time Interval Analyzer - Single Shot BPSK Signal Characterization  
AN-358-9 1989 5372A HP 5372A Frequency and Time Interval Analyzer - Modulation Domain Techniques for Measuring Complex Radar Signals  
AN-358-9 1991 5372A Technique de Mesure de Signaux Radar Complexes dans le Domaine de Modulation (French Translation of AN 358-9)  
AN-358-10 1989 5372A HP 5372A Frequency and Time Interval Analyzer - Characterizing Baker Coded Modulation in Radar Systems  
AN-358-11 1989 5372A HP 5372A Frequency and Time Interval Analyzer - Characterizing Shirp Coded Modulation in Radar Systems  
AN-358-12 1990 5371A-5372A Simplify Freqency Stability Measurement with Built-in Allan Variance Analysis  
AN-358-12 1990 5371A-5372A Simplifiez les Mesures de Stabilité en Fréquence à l'Aide de l'Analyse de Variance d'Allan Intégrée (French Translation of AN 358-12)  
AN-358-13 1990 5372A Analysing Phase-Locked Loop Capture and Tracking Range  
AN-360 1987 378X Jitter Tolerance Testing Using Phase or Frequency Modulated Sources and Bit Error Rate Test Sets  
AN-361 1988 815X Traceability of Optical Power Measurements - How Traceability to National Standards is Provided by Hewlett-Packard  
AN-362 1988 815X-3764A Bit Error Rate Measurements on Optical Fiber Systems  
AN-364-1 1988 - Quality Gains in Telecom Australia's Digital Microwave Network  
AN-364-2 1990 3709B Digital Radio Testing with British Telecom  
AN-366-1 1986 815X-8145A How to Measure Insertion Loss of Optical Components  
AN-366-2 1988 815X How to Measure Return Loss of Optical Components  
AN-366-3 1988 8145A How to Measure Return Loss in Optical Links Using the HP 8145A OTDR  
AN-369-1 1998 4284A Optimizing Electronic Component and Material Impedance Measurements Taking Full Advantage of the HP 4284A Precision LCR Meter  
AN-369-2 1988 4284A Tantalum Electrolytic Capacitor Measurements in Production and Quality Control Departments - HP 4284A Precision LCR Meter  
AN-369-3 1988 4284A Impedance Measurements of Magnetic Heads Using Constant Current in Production and Quality Control Departments  
AN-369-4 1988 4284A Recommending Electronic Manufacturers to Perform Incomming Inspection - HP 4284A Precision LCR Meter  
AN-369-5 1998 4284A Multi-Frequency C-V Measurements of Semiconductors - HP 4284A Precision LCR Meter  
AN-369-6 1988 4284A Impedance Testing Using Scanner - HP 4284A Precision LCR Meter  
AN-369-7 1998 4284A Measurement of Capacitance Characteristics of Liquid Crystal Cell with HP 4284A Precision LCR Meter  
AN-369-8 1998 4284A-42841A Wide Range DC Current Biased Inductance Measurement with HP 4284A Precision LCR Meter / HP 42841A Bias Current Source  
AN-369-9 1989 4284A-4285A Improve Electronic Product Quality and Performance with HP Precision LCR Meters - HP 4284A and HP 4285A Precision LCR Meters  
AN-369-10 1991 4284A-4285A High Accuracy And Fast RF Inductor Testing  
AN-371 1992 71400 HP 71400 Lightwave Signal Analyzer - Measuring Modulated Light  
AN-372-1 1988 60XX Power Supply Testing  
AN-372-2 1988 60XX Battery Testing  
AN-372-3 1988 60XX-66XX Power Components Testing  
AN-374-1 1988 8510B-8340B Antenna Measurements - Manual Pattern Measurements Using the HP 8510B  
AN-376-1 1988 662X Biasing Three-Terminal Devices for Test - A precise Solution for Component Evaluation and Sub-Assembly Testing…  
AN-377-1 1989 5361A Automatic Frequency Profiling of Chirped Radar Pulses Using the HP 5361A 20 GHz Pulse / CW Microwave Counter  
AN-377-2 1989 5361A Automatic Characterization of Microwave VCO's Using the HP 5361A 20 GHz Pulse / CW Microwave Counter  
AN-377-3 1989 5361A Frequency Profiling Without a Pulse Generator Using the HP 5361A 20 GHz Pulse / CW Microwave Counter's Built-In Profiling  
AN-377-4 1990 5361B Frequency and Phase Profiling Simplified with the HP 5361B Pulse / CW Microwave Counter  
AN-378-1 1989 3585B Harmonic Distortion Measurements - Enhancing Speed and Performance with Spectrum Analysis  
AN-379-1 1989 11757A Measuring Digital Microwave Radio M-Curves / Signatures  
AN-379-2 1990 11758T Measuring Microwave Radio Antenna Return Loss Using the HP 11758T Digital Radio Test System  
AN-380-1 1989 16451B Dielectric Constant Measurement of Solid Materials Using the HP 16451B Dielectric Test Fixture  
AN-380-2 1990 4195A-4284A Measuring Cable Parameters - HP Precision LCR Meters and Impedance Analyzers  
AN-380-3 1995 - Evalution of Colloids by Dielectric Spectroscopy  
AN-381 1989 5412X-8131A A Test Setup for Characterizing High-Speed Logic Devices  
AN-381-1 1990 5412X-8131A Test Setup for At-Speed Schmitt-Trigger Characterization  
AN-383-1 1989 4142B Simplification of DC Characterization and Analysis of Semiconductor Devices  
AN-383-2 1990 4142B Automation of DC Characterization and Analysis of Semiconductor Devices  
AN-385 1989 3048A Millimeter Measurements Using the HP 3048A Phase Noise Measurement System  
AN-386 1990 3048A Pulsed Carrier Phase Noise Measurements Using the HP 3048A Phase Noise Measurement System  
AN-387 1990 378X-37721A High Productivity Measurements in Digital Transmission  
AN-388 1990 - Signal Generator Spectral Purity  
AN-390 1990 82000 Synchronizing the HP 82000 to External Equipment  
AN-392-1 1990 165XX How the Right Preprocessor Interface Can Simplify Logic Analysis - Aerospace and Defense Applications  
AN-392-2 1990 165XX How the Right Preprocessor Interface Can Simplify Logic Analysis - PC and PC Add-On Applications  
AN-392-3 1990 165XX How the Right Preprocessor Interface Can Simplify Logic Analysis - VME / VXI Applications  
AN-392-4 1990 165XX How the Right Preprocessor Interface Can Simplify Logic Analysis - Workstation / Server Applications  
AN-392-5 1990 165XX How the Right Preprocessor Interface Can Simplify Logic Analysis - Computer Peripheral Applications  
AN-392-6 1990 165XX How the Right Preprocessor Interface Can Simplify Logic Analysis - Industrial / Automotive Applications  
AN-393 1990 3562A Monitoring of Ultrasonic Wire Bonding Machines  
AN-394 1990 54502/503A Digitizing Oscilloscope Option 001 Telecommunications Mask  
AN-397-1 1990 4951X-4952A ISDN Testing Techniques for the HP 4954I and the HP 4951C / HP 4952A WAN Protocol Analyzers  
AN-398-2 1990 - Correlation of Timing Measurements  
AN-398-3 1991 82000 Measuring CMOS Quiescent Power Supply Current (Iddq) with the HP 82000  
AN-398-4 1991 82000 High Speed Continuity/Shorts Test on the HP 82000  
AN-398-5 1991 - Automatic Path Delay Compensation  
AN-399 1990 4972A Problem Isolation Techniques for Ethernet 802.3 Local Area Networks  
AN-400-1 1979 - Factory data collection - A Quality assurance early warning system  
AN-400-2 1978 HP1000 Factory data collection - An eg of how to implement an HP 1000-based labor and job status reporting system  
AN-401-1 ? HP1000 HP-IB Programming Proceedures  
AN-401-1L ? HP1000 L-Series/HP-IB programming proceedures  
AN-401-2 1979 HP1000 HP59307A HP59307A VHF switch HP1000 Computer Programming Guide  
AN-401-3 1979 HP1000-5345A 5345A Electronic Counter HP-IB/HP 1000 Programming Example  
AN-401-4 1979 HP1000-5342A 5342A Microwave Frequency Counter HP 1000 Computer Programming Guide  
AN-401-5 1979 HP1000-5328A 5328A Counter  
AN-401-6 1979 HP1000-3438A 3438A Digital Multimeter  
AN-401-7 1979 HP1000-3455A 3455A Digital Voltmeter HP 1000 Computer Programming Guide  
AN-401-8 1979 HP1000-59309A 59309A Digital Clock  
AN-401-9 1979 HP1000-6002A 6002A Power Supply  
AN-401-10 1979 HP1000-3437A 3437A Digital Voltmeter  
AN-401-11 1979 HP1000-3495A 3495A Scanner  
AN-401-12 1979 HP1000-3582A 3582A Spectrum Analyzer  
AN-401-13 1979 HP1000-3325A 3325A Function Generator  
AN-401-14 1979 HP1000-4262A 4262A Digital LCR Meter  
AN-401-15 1979 HP1000-8672A 8672A Synthesized Signal Generator HP 1000 Computer Programming Guide  
AN-401-16 1979 HP1000-436A 436A Microwave Power Meter HP 1000 Computer Programming Guide  
AN-401-17 1979 HP1000-8620C 8620C Sweep Oscillator HP 1000 Computer Programming Guide  
AN-401-18 1979 HP1000 HP59306A HP59306A Relay Actuator HP1000 Computer Programming Guide  
AN-401-19 1979 HP1000-8660C 8660C Synthesized Signal Generator  
AN-401-20 1979 HP1000-9871A 9871A Character Impact Printer  
AN-401-21 1979 HP1000-6942A 6942A Multiprogrammer II  
AN-414 1982 HP1000 HP 1000 Real Time Computers - Hardware Reliability Modeling for Systems Using Dynamic Redundancy  
AN-417-1 1986 9000-S200-S300 HP Basic I/O Concepts for the HP 9000 Series 200 and Series 300  
AN-421-1 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Commercial Energy Conservation  
AN-421-2 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Fan Testing  
AN-421-3 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Vehicle Body Testing  
AN-421-4 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Wastewater Treatment  
AN-421-5 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Jet Engine Controler Testing  
AN-421-6 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Internal Combustion Engine Testing  
AN-421-7 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Environmental / Autoclave Testing  
AN-421-8 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Communication Cable Testing  
AN-421-9 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Residential Facility Testing  
AN-421-10 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Canning Process Characterization  
AN-421-11 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Explosion Testing  
AN-421-12 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Materials Development  
AN-421-13 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Plating Line Control  
AN-421-14 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Battery Testing  
AN-421-15 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Pilot Plant Monitoring  
AN-421-16 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Jet Engine Testing  
AN-421-17 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Facility Management  
AN-421-18 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - "Large Product" Characterization  
AN-421-19 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Missile System Testing  
AN-421-20 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Machine Monitoring Control  
AN-421-21 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Pharmaceutical Process Control  
AN-421-22 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Paper Process Characterisation  
AN-421-23 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Rolling Mill  
AN-421-24 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Appliance Testing  
AN-421-25 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Airframe Testing  
AN-421-26 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - On-Road Vehicle Testing  
AN-421-27 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Pumping Station Control  
AN-421-28 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Receiver Testing  
AN-421-29 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Bed-of-Nails Testing for Digital to Analog Converters  
AN-421-30 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Environmental Test of Automotive Radios and Engine Controllers  
AN-421-31 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Sonar System Testing  
AN-421-32 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Environmental Test of Electronic Subassemblies  
AN-422 1988 HP9000 X.25 Communications for the HP 9000 Series 800 Computer  
AN-424 1988 4951C-4952A Keeping your Big Blue network in the pink  
AN-425 1990 4951C-4952A The care and feeding of your X.25 network  
AN-426 1989 9000-S300 File Sharing Between HP BASIC/WS, HP BASIC/UX, and HP-UX for HP 9000 Series 300 Computers  
AN-428 1990 - Task Broker for the Hewlett-Packard Family of Workstations  
AN-718 1971 - Patient Safety  
AN-904 1966 - The PIN Diode  
AN-907 1967 - The Hot Carrier Diode - Theory, Design and Application  
AN-909 1966 - Electrical Isolation Using the HPA 4310  
AN-910 1968 - Optoelectronic Coupling for Coding, Multiplexing and Channel Switching  
AN-911 ? - Low Level DC Operation Using HP Photochoppers  
AN-912 1966 - An Attenuator Design Using PIN Diodes - Constant Impedance Current Controlled 10 MHz to 1,0 GHz Bandwidth  
AN-913 1967 - Step Recovery Diode Frequency Multiplier Design  
AN-914 1967 - Biasing and Driving Considerations for PIN Diode RF Switches and Modulators  
AN-915 1967 - Threshold Detection of Visible and Infrared Radiation with PIN Photodiodes  
AN-916 1967 - HPA GaAs Sources  
AN-917 1967 - HPA PIN Photodiode  
AN-918 1968 - Pulse and Waveform Generation with Step Recovery Diodes  
AN-919 1968 - Optmizing Signal-to-Noise Ratio in Photochopper Applications  
AN-920 1968 - Harmonic Generation Using Step Recovery Diodes and SRD Modules  
AN-921 ? - The 33800 Series Mixer / Detector Module  
AN-922 ? - Applications of PIN Diodes  
AN-923 ? - Hot Carrier Diode Video Detectors  
AN-923 1986 - Schottky Barrier Diode Video Detectors  
AN-928 ? - Ku-Band Step Recovery Multiplier  
AN-929 ? - Fast Switching PIN Diodes  
AN-930 1970 - Handling and Assembling HP Transistor Chips  
AN-931 1970 - Solid State Alphanumeric Display - Decoder / Driver Circuitry  
AN-932 1974 - Selection and Use of Microwave Diode Switches and Limiters  
AN-934 1972 5082-7300 5082-7300 Series Solid state Display Installation Techniques  
AN-935 1971 - Microwave Power Generation and Amplification Using Impatt Diodes  
AN-936 1971 - High Performance PIN Attenuator for Low Cost AGC Applications  
AN-938 ? - Solid State Lamp Installation Note  
AN-942 1973 - Shottky Diodes for High Volume, Low Cost Applications  
AN-944-1 1973 - Microwave Transistor Bias Considerations  
AN-947 1976 - Digital Data Transmission Using Optically Coupled Isolators  
AN-951-2 1976 - Linear Applications of Optically Coupled Isolators  
AN-956-1 1990 - The Criterion for the Tangential Sensitivity Measurement  
AN-956-3 1988 - Flicker Noise in Schottky Diodes  
AN-956-4 1995 - Schottky Diode Voltage Doubler  
AN-956-5 1975 - Dynamic Range Extension of Schottky Detectors  
AN-956-6 1995 - Temperature Dependence of Schottky Detector Voltage Sensitivity  
AN-957-1 1996 - Broadbanding the Shunt PIN Diode SPDT Switch  
AN-957-2 1974 - Reducing the Insertion Loss of a Shunt PIN Diode  
AN-957-3 1975 - Rectification Effects In PIN Attenuators  
AN-959-1 1974 - Factors Affecting Silicon IMPATT Diode Reliability and Safe Operation  
AN-959-2 1975 - Reliability of Silicon IMPATT Diodes  
AN-961 1976 - Silicon Double-Drift IMPATT Diodes for Pulse Application  
AN-962 1975 - Silicon Double-Drift IMPATT Diodes for High-Power Microwave Application  
AN-963 1980 - Impedance Matching Techniques for Mixers and Detectors  
AN-967 1975 - A Low Noise 4 GHz Transistor Amplifier Using the HXTR-6101 Silicon Bipolar Transistor  
AN-968 1976 - IMPATT Amplifier  
AN-969 1976 - An Optimum Zero Bias Schottky Diode Detector  
AN-970 ? - A 6GHz Amplifier Using the HFET-1101 GaAs FET  
AN-971 1988 - The HPND-4050 Beam Lead Mesa PIN in Shunt Application  
AN-976 1988 - Broadband Microstrip Mixer Design – The Butterfly Mixer  
AN-979 1981 - The Handling and Bonding of Beam Lead Devices Made Easy  
AN-983 ? - Comb Generator Simplifies Multiplier Design  
AN-984 1981 - How To Get More Output Power From a Comb Generator Module With the Right Bias Resistance  
AN-985 ? - Achieve High Isolation in Series Applications with the Low Capacitance HPND-4005 Beam Lead PIN  
AN-986 1981 - Square Law and Linear Detection  
AN-987 1982 - Is Bias Current Necessary?  
AN-988 1982 - All Schottky Diodes are Zero Bias Detectors  
AN-989 1982 - Step Recovery Diode Doubler  
AN-991 1984 - Harmonic Mixing with the HSCH-5500 Series Dual Diode  
AN-992 1993 - Beam Lead Attachment Methods  
AN-993 1987 - Beam Lead Device Bonding to Soft Substrates  
AN-993-1 1990 - Thermal Stress Relief In Beam Lead Diode Assembly  
AN-995 1986 - The Schottky Diode Mixer  
AN-997 1987 - A 2 GHz Balanced Mixer Using SOT-23 Surface Mount Schottky Diodes  
AN-999 1995 - GaAs MMIC Assembly and Handling Guidelines  
AN-1006 1980 LED-DISPLAY Seven Segment LED Display Applications  
AN-1011 1984 - Conception et Mise en Œuvre des Codeurs Incrémentiels HEDS-5000 et HEDS-6000  
AN-1025 1985 - Applications and Circuit Design for the HEDS-7000 Series Digital Potentiometer  
AN-1034 1988 815X How to Make Accurate Fiber Optic Power Measurements  
AN-1043 1991 - Common-Mode Noise: Sources and Solutions  
AN-1047 ? HSSR-7110 On-Resistance Solid-State Relays For High Reliability Applications  
AN-1048 ? - A Low-Cost Surface Mount PIN Diode π Attenuator  
AN-1049 ? - A Low Distortion PIN Diode Switch Using Surface Mount Devices  
AN-1050 1993 - Low Cost Surface Mount Power Limiters  
AN-1052 1992 - A Low Cost, Surface Mount X-Band Mixer  
AN-1054 1992 - Low Cost Frequency Multipliers Using Surface Mount PIN Diodes  
AN-1055 1993 - Clock Recovery Using Si MMICs  
AN-1064 1994 - Low Noise and Moderate Power Amplifier Using ATF-21186  
AN-1067 ? - An SPDT PIN Diode T/R Switch for PCN Applications  
AN-1069 1998 - Non-RF Applications for the Surface Mount Schottky Diode Pairs HSMS-2802 and HSMS-2822  
AN-1071 1994 - Battery Operation of the INA-03184  
AN-1072 ? - Applications for the HSMP-3890 Surface Mount Switching PIN Diode  
AN-1076 ? - Using the ATF-10236 in Low Noise Amplifier Applications in the UHF through 1.7 GHz Frequency Range  
AN-1083 1996 - IMFET Handling and Design Guidelines  
AN-1084 1996 - Two-Stage 800 – 1000 MHz Amplifier Using the AT-41511 Silicon Bipolar Transistor  
AN-1085 ? - 900 and 2400 MHz Amplifiers Using the AT-3 Series Low Noise Silicon Bipolar Transistors  
AN-1088 1997 - Designing the Virtual Battery  
AN-1089 1997 - Designing Detectors for RF/ID Tags  
AN-1090 1997 - The Zero Bias Schottky Diode Detector at Temperature Extremes –Problems and Solutions  
AN-1091 1996 - 1 and 2 Stage 10.7 to 12.7 GHz Amplifiers Using the ATF-36163 Low Noise PHEMT  
AN-1097 1997 - L and S Band Amplifiers using the ATF-36163 Low Noise PHEMT  
AN-1116 ? - Using the MGA-87563 GaAs MMIC in Low Noise Amplifier Applications in the 800 Through 2500 MHz Frequency Range  
AN-1124 1997 - Linear Models for Diode Surface Mount Packages  
AN-1126 ? - Evaluation of Vector Modulator IC Performance  
AN-1128 1997 - L Band Amplifier using the ATF-36077 Low Noise PHEMT  
AN-1129 1998 - Low Noise Amplifier for 2.3 GHz using the ATF-36077 Low Noise PHEMT  
AN-1131 1997 - Low Noise Amplifiers for 320 MHz and 850 MHz Using the AT-32063 Dual Transistor  
AN-1133 1997 - Low Noise Amplifier for 5.7 GHz using the ATF-36077 Low Noise PHEMT  
AN-1136 1998 - Low Cost Mixer for the 10.7 to 12.8 GHz Direct Broadcast Satellite Market  
AN-1139 1998 - 950 to 2400 MHz IF Amplifier Using the INA-51063 and INA-54063  
AN-1145 1999 - Phase Locked Loop Frequency Synthesizer Demonstration Circuit Board  
AN-1147 1998 - Using the INA-12063 RFIC Amplifier for 2.4 GHz Applications  
AN-1155-3 1998 - LED Stop Lamps Help Reduce the Number and Severity of Automobile Accidents  
AN-1156 1998 - Diode Detector Simulation using Hewlett-Packard EESOF ADS Software  
AN-1160 1998 - 1800 to 1900 MHz Amplifiers using the HBFP-0405 and HBFP-0420 Low Noise Silicon Bipolar Transistors  
AN-1161 1998 - 800 to 950 MHz Amplifiers using the HBFP-0405 and HBFP-0420 Low Noise Silicon Bipolar Transistors  
AN-1163 1998 - Compact HSMP-389V Transmit/Receive Switch Design  
AN-1168 1999 - 1800 MHz Medium Power Amplifier using the HBFP-0450 Silicon Bipolar Transistor  
AN-1176 1999 - Advantage of SnapLED 150 LED Product Compared to other Lighting Technologies in Automotive Signal Lamps  
AN-1200-1 1990 53310A HP 53310A Modulation Domain Analyzer - Simplified Motor Spin-Up Analysis  
AN-1200-2 1990 53310A HP 53310A Modulation Domain Analyzer - Direct Characterization of Motion Control Systems  
AN-1200-3 1990 53310A HP 53310A Modulation Domain Analyzer - VCO Step Response Analysis Made Easy  
AN-1200-4 1990 53310A HP 53310A Modulation Domain Analyzer - Quick Identification of Periodic Jitter Sources  
AN-1200-5 1990 53310A HP 53310A Modulation Domain Analyzer - Fast Characterization of Pulse Width Encoded Data  
AN-1200-6 1990 53310A HP 53310A Modulation Domain Analyzer - Simple Analysis of Frequency Modulation  
AN-1200-7 1990 53310A HP 53310A Modulation Domain Analyzer - Simplified Analysis of Phase-Locked Loop Capture and Tracking Range  
AN-1200-8 1990 53310A HP 53310A Modulation Domain Analyzer - Single Shoot Frequency Profiling of Chirped Radars Made Easy  
AN-1200-9 1990 53310A HP 53310A Modulation Domain Analyzer - Histograms Simplify Analysis of Random Jitter  
AN-1200-10 1990 53310A HP 53310A Modulation Domain Analyzer - Examine Channel Switching Characteristics of Cellular Radios  
AN-1200-11 1993 53310A HP 53310A Modulation Domain Analyzer - Examine GMSK Modulation in GSM and PCN Mobile Communications Systems  
AN-1200-12 1991 53310A HP 53310A Modulation Domain Analyzer - Peak Deviation and Center Frequency Measurements for CT2 and DECT Radios  
AN-1201-4 1991 - Advanced Bipolar Transistor Modeling Techniques  
AN-1201-5 1992 4062UX Model Parameter Monitoring with the HP 4062UX, IC-CAP and IC-MS  
AN-1202-1 1990 8751A HP 8751A Network Analyzer 5Hz to 500MHz - Designing Impedance Matching Networks with the HP 8751A  
AN-1202-2 1991 8751A HP 8751A Network Analyzer 5Hz to 500MHz - 17 Fixtures, Test Sets and Accessories for the HP 8751A  
AN-1202-3 1991 8751A HP 8751A Network Analyzer 5Hz to 500MHz - 3 Steps to Better Baseband, IF and RF Design with the HP 8751A  
AN-1203-1 1991 - Modeling Passive High-Speed Digital Structures  
AN-1205 1991 4142B Efficient Microwave Bias and Test Using the HP 4142B Modular DC Source / Monitor  
AN-1206-1 1991 HP Vee Complete Data Acquisition Solutions with HP VEE-Test  
AN-1206-2 1991 HP Vee Design Characterization Using HP VEE-Test  
AN-1207-1 1991 823XX Multiprocessing with HP Measurement Coprocessors  
AN-1207-2 1991 823XX Installing Multiple HP Measurement Coprocessors  
AN-1210-1 1991 4194A Characterizing IC Packages with Impedance Measurements and the UTP-3000 Test Fixture  
AN-1210-2 1991 - Understanding and Minimizing Probing Effects  
AN-1210-3 1991 813X Simulating Noise Signals for Tolerance Testing  
AN-1210-4 1991 - Characterizing Jitter of a D Flip-Flop  
AN-1210-5 1991 54121T Characterizing IC Packages with TDR / TDT and the UTP-3000 Test Fixture  
AN-1210-6 1991 5412X-8131A Characterizing Jitter with a Digitizing Oscilloscope  
AN-1210-7 1991 - Design for Testability Using Boundry-Scan 1149.1  
AN-1210-8 1991 - Improving jitter in Computer Clocks  
AN-1210-9 1991 - Monitoring of Ultrasonic Wire Bonding Machines  
AN-1210-10 1992 54720A-8133A Timing Considerations in Clock Distribution Networks  
AN-1210-11 1992 8510-87XX Simulation and Optimization Methods for MCM Substrates  
AN-1210-14 1992 4194A-875X Electrical Characterization Methods for MCM Substrates  
AN-1210-16 1994 - Characterizing the Performance of High-Speed Digital-to-Analog Converters  
AN-1211-1 1991 37722-37732 Standard and CRC-4 Frame Testing  
AN-1211-2 1991 377XX Testing N x 64 Kb/s Services  
AN-1211-3 1991 377XX Testing Sub-Rate Data Services  
AN-1212 1991 - Characterizing Components with a Microwave Tracking Source  
AN-1213 1991 3588A-3589A Better Noise Measurements with the HP 3588A & HP 3589A  
AN-1214 1991 54510A Sequential Single-Shot Optimizes Speed, Memory Depth and Throughput  
AN-1216-1 1992 4142B Performing High-Speed Parameter Extractions on High-Power Devices Using the HP 4142B Modular DC Source / Monitor  
AN-1216-2 1992 4142B An Automated DC Parameter Measurement System for Power Modules and Smart Power ICs Using the HP 4142B Modular DC Source / Monitor  
AN-1217-1 1992 419X-875X Basics of Measuring the Dielectric Properties of Materials  
AN-1218-1 1992 7145X Optical Spectrum Analysis Basics  
AN-1219-1 1992 82335B HP 82335B HP-IB for Windows - Utilizing DDE for Test and Measurement Applications  
AN-1219-2 1992 82335B HP 82335B HP-IB for Windows - Creating Instrument Control Applications with Visual Basic and HP-IB for Windows  
AN-1219-3 1992 82335B HP 82335B HP-IB for Windows - Creating Software Front Panels for Your VXI Instruments  
AN-1221 1992 54701A Differential Measurements on Wideband Signals  
AN-1222 1992 - Troubleshooting Simultaneous Switching Noise Problems  
AN-1223 1992 16550A Logic Analyzer Triggering Applications for the HP 16550A 100 MHz State / 500 MHz Timing Module  
AN-1224-1 1992 4338A-4339A Contact Resistance and Insulation Resistance Measurements of Electro-Mechanical Components  
AN-1224-2 1992 4339A Insulation Resistance Measurements of the Plate Type Materials  
AN-1224-3 1992 4263A Effective Transformers / LF Coils Testing  
AN-1224-4 1992 4263A Effective Electrolytic Capacitors Testing  
AN-1225-1 1992 16542A Imaging and DSP Testing with the HP 16542A  
AN-1225-2 1992 16542A Cache Hit or Miss Analysis with the HP 16542A  
AN-1225-3 1992 16542A Digital Video Testing with the HP 16542A  
AN-1225-4 1992 16542A Analog-to-Digital Converter Testing with the HP 16542A  
AN-1230 1992 35665A Sound Power Measurements  
AN-1237-1 1993 - Maximizing Revenue with In-Service Testing - Introduction  
AN-1237-2 1993 - Maximizing Revenue with In-Service Testing - Centralized Test/Monitor Systems  
AN-1241 1993 54720-1143A Microprobing with the Fine-Pitch Active Probe  
AN-1242 1992 - Microprobing Essentials for Fine Pitch Modules  
AN-1244-1 1995 - Minimizing Instrusion Effects When Probing With a Logic Analyzer  
AN-1244-2 1993 - Designing a Custom Interface for a Logic Analzyer Using HP User Definable Design Tools  
AN-1245 1993 16500X PC Network Connectivity with the HP 16500L Interface Module  
AN-1246 1993 6060B Pulsed Characterization of Power Semiconductors Using Electronic Loads  
AN-1253 1994 VXI Real-Time System Measures Aircraft Flight Characteristics  
AN-1260-1 1993 4396A Combining Network and Spectrum Analysis and IBASIC to Improve Device Characterization and Test Time  
AN-1266-1 1994 16500X Intel 80960CA Software Debug Using a Logic Analyzer and an In-Circuit Debugger  
AN-1267 1995 71501B-703XX Frequency Agile Jitter Measurement System  
AN-1270-1 1995 VXI ++ Final Test and Alignment for Cellular Phones & Failure Analysis and Repair for Cellular Phones  
AN-1270-2 1995 VXI ++ VHF Transceiver Testing  
AN-1270-3 1995 VXI ++ Prototype Aircraft Jet Engine Characterization and Test  
AN-1270-4 1995 VXI ++ Electronic Heater Valves Testing  
AN-1270-5 1995 VXI ++ Vehicle Body Testing  
AN-1270-6 1995 VXI ++ On Road Vehicle Testing  
AN-1270-7 1995 VXI ++ Communication Cable Testing  
AN-1270-8 1995 VXI ++ Airframe Testing  
AN-1270-9 1995 VXI ++ Jet Engine Controller Testing  
AN-1270-10 1995 VXI ++ Jet Engine Testing  
AN-1270-11 1995 VXI ++ Environmental Test of Automotive Radios and Engine Controllers  
AN-1270-12 1995 VXI ++ Automotive Relay Modules Testing  
AN-1272 1996 58503A-59551A GPS and Precision Timing Applications  
AN-1273 1995 6840 Compliance Testing to the IEC 1000-3-2 (EN 61000-3-2) and IEC 1000-3-3 (EN 61000-3-3) Standards  
AN-1275 2000 - Automatic Frequency Settling Time Measurement Speeds Time-to-Market for RF Designs  
AN-1279 1996 5071A-58503A HP SmartClock Technology - Improving Oscillator Long-Term Stability for Synchronization Applications  
AN-1279 1998 5071A-58503A HP SmartClock Technology - Improving Oscillator Long-Term Stability for Synchronization Applications  
AN-1286-1 1997 856X-859X 8 Hints for Making Better Spectrum Analyzer Measurements  
AN-1286-1 2005 856X-PSA-ESA Agilent 8 Hints for Better Spectrum Analysis  
AN-1287-1 1997 87XX Understanding the Fundamental Principles of Vector Network Analysis  
AN-1287-2 1997 87XX Exploring the Architectures of Network Analyzers  
AN-1287-3 1997 87XX Applying Error Correction to Network Analyzer Measurements  
AN-1287-4 1997 87XX Network Analyzer Measurements: Filter and Amplifier Examples  
AN-1287-7 1998 87XX Improving Network Analyzer Measurements of Frequency-Translating Devices  
AN-1287-11 2011 87XX Specifying Calibration Standards and Kits for Agilent Vector Network Analyzers  
AN-1287-12 2012 87XX Agilent Time Domain Analysis Using a Network Analyzer  
AN-1288-1 1997 4396B Combining Network and Spectrum Analyses and IBASIC to Improve Device Characterization and Test Time  
AN-1288-2 1994 4396B Configuring the HP 4396B for Optical / Electrical Testing  
AN-1288-4 1997 4396B How to Characterize CATV Amplifiers Effectively  
AN-1289 1997 - The Science of TimeKeeping  
AN-1291-1 1997 87XX-8510 8 Hints for Making Better Network Analyzer Measurements  
AN-1293 1997 E435X Sequential Shunt Regulation - Regulating Satellite Bus Voltage  
AN-1296 1997 - LMDS - The Wireless Interactive Broadband Access Service  
AN-1297 1997 42XX-43XX-87XX Solution for Measuring Permittivity and Permeability - Meeting Tomorrow's Material Test Challenges  
AN-1298 1997 - Digital Modulation in Communications Systems - An Introduction  
AN-1299 1997 37778A-71451B Introduction to BER Testing of WDM Systems  
AN-1301 1998 - Effective Spectrum Analysis Testing for Consumer Electronics Production Lines  
AN-1303 1998 859X-856X Spectrum Analyzer Measurements and Noise - Measuring Noise and Noise-Like Digital Communications Signals with a Spectrum Analyzer  
AN-1303 2003 859X-856X Agilent Spectrum Analyzer Measurements and Noise  
AN-1304-2 1988 54750A-83480A Time Domain Reflectometry Theory  
AN-1304-4 2000 54750A Measuring Characteristic Impedance of Short RAMBUS Motherboard Traces and Small-Outline RIMM's  
AN-1307 1998 87XX-85XX Testing CDMA Base Station Amplifiers - Measurements Fundamentals of Characterizing the Linear and Non-Linear Behavior of CDMA Amplifiers  
AN-1308-1 1998 4395A-4396A Network, Spectrum, and Impedance Evaluation of Electronic Circuits and Components  
AN-1310 1999 - Mobile Communications Device Testing - Considerations when Selecting a System Power Supply  
AN-1313 2000 - Agilent Technologies Wireless Test Solutions - Testing and Troubleshooting Digital RF Communications Transmitter Designs  
AN-1315 2000 - Optimizing RF and Microwave Spectrum Analyzer Dynamic Range  
AN-1316 1999 85XX Optimizing Spectrum Analyzer Amplitude Accuracy  
AN-1323 2000 - Internet Advisor - Testing and Troubleshooting Medium and High Speed Frame Relay Networks  
AN-1326 2000 - 8 hints for solving common debugging problems with your logic analyzer  
AN-1333 1999 - Performing Bluetooth RF Measurements Today  
AN-1333 2000 - Agilent - Performing Bluetooth RF Measurements Today  
AN-1337 2006 - Feeling Comfortable with Logic Analyzers  
AN-1354 2000 - Practical Noise-Figure Measurement and Analysis for Low-Noise Amplifier Designs  
AN-1370-1 2000 HP Vee Data Logging Using Remote Programming  
AN-1382-10 2000 - 8 hints for debugging and validating high-speed busses  
AN-1419-3 2008 - Performance Comparison of Differential and Single-Ended Active Voltage Probes  
AN-1449-2 2006 - Agilent Fundamentals of RF and Microwave Power Measurements (Part 2)  
AN-1449-4 2006 - Agilent Fundamentals of RF and Microwave Power Measurements (Part 4)  
AN-1450 2003 - Logic Analyzer Probing Techniques for High-Speed Digital Systems  
AN-1478 2006 - 7 Reasons to Migrate from your 8753 to an ENA Network Analyzer  
AN-1487 2004 NFA Agilent Noise Figure Measurements of Frequency Converting Devices  
AN-1550-4 ? - Optical spectrum analysis  
AN-1550-6 1992 8702-8703 High-Speed Lightwave Component Analysis  
AN-1592 2009 - Tips and Techniques for Making Power Supply Noise Measurements with an Oscilloscope  
AN-1607 2008 - Oscilloscope probing for high-speed signals  
AN-8510-5B 2006 8510 Agilent Specifying Calibration Standards for the Agilent 8510 Network Analyzer  

++ reference to the overall product line of the instrument listed

Application Notes type A

Reference Year Instrument Title Keysight
AN-A001 1993 - Notes On Choke Network Design  
AN-A002 1993 - Design of a 4 GHz LNA for a TVRO System  
AN-A004R 1993 - Electrostatic Discharge Damage and Control  
AN-A005 1993 - Transistor Chip Use  
AN-A006 1993 - Mounting Considerations for Packaged Microwave Semiconductors  
AN-A008 1995 - Microwave Oscillator Design  

Application Notes type AB

Reference Year Instrument Title
AN-AB0005 1980 - Current Source for Diode Testing
AN-AB0010 1991 - Limiting Characteristics of the IVA-05118 Variable Gain Amplifier
AN-AB0013 1999 - SPICE Models for the IAM- 81 and IAM-82 Active Mixers
AN-AB0102 1997 - HPMX-5001 Demonstration Circuit Board (Up/Down Converter)

Application Notes type G

Reference Year Instrument Title Keysight
AN-G001 1993 - ATF-13136 Demonstration Amplifier  
AN-G002 1992 - ATF-10136 Demonstration Amplifier  
AN-G003 1993 - MGA-64135 GaAs MMIC  
AN-G004 1993 - S-Band Low Noise Amplifier Using the ATF-10136  
AN-G005 1992 - Active GaAs FET Mixers Using the ATF-10136, ATF-13736, and ATF-13484  
AN-G006 1992 - MGA-64135 GaAs MMIC as a Variable-Gain Amplifier and Operation at Reduced Vdd  
AN-G007 1992 - MGS Series Monolithic GaAs Switches  

Application Notes type M

Reference Year Instrument Title Keysight
AN-M022 1997 - Installing TO-8 Oscillators  
AN-M024 1997 - Voltage-Controlled Oscillators Evaluated for System Design  

Application Notes type S

Reference Year Instrument Title Keysight
AN-S001 1993 - Basic MODAMP MMIC Circuit Techniques  
AN-S002 1993 - MODAMP™ MMIC Nomenclature  
AN-S003 1997 - Biasing MSA Series RF Integrated Circuits  
AN-S004 1993 - A Broadband IF Amplifier Using MSA-0235 and MSA-0335  
AN-S005 1997 - Using Hewlett-Packard MSA Series MMIC Amplifiers as Frequency Converters  
AN-S006 1992 - Using External Feedback to Achieve Flat Gain with the MSA-0885  
AN-S007 1993 - Using the MSA-0520 and MSA-1023 Medium-Power MODAMP Silicon MMIC Amplifiers  
AN-S008 1993 - Designing With The MSA-9970  
AN-S009 1993 - MODAMP Silicon MMIC Chip Use  
AN-S010 1998 - A 5.0 GHz Bipolar Active Mixer  
AN-S011 1993 - Using Silicon MMIC Gain Blocks as Transimpedance Amplifiers  
AN-S012 1997 - INA Series RFIC Amplifiers  
AN-S013 1993 - IAM-8 Series Active Mixers  
AN-S014 1993 - 750-1250MHz VCO  

Compendium

Reference Year Title
transistor 1997 High-Frequency Transistor Primer (Part I/II/III)
? 1992 Microwave theory and measurements
? 1992 HP GPIB Programmers Guide
grounding 2002 Agilent Technologies Considerations for Instrument Grounding

Harrison Tech Letter

Reference Year Title
2 1964 Constant Voltage/Constant current Regulated Power Supplies
3 1964 Measurement of Line and Load Regulation of DC Power Supplies
4 1964 Measurement of Output Impedance of a Constant Voltage Power Supply
7 1964 Notes On DC Power Supply Isolation Measurement
8 1965 6920A Meter Calibrator Application Notes

References