Re: [SI-LIST] : Measuring parasitic values

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From: Michael Nudelman (mnudelman@tellium.com)
Date: Wed Sep 20 2000 - 18:35:25 PDT


Barry,

What we do is simply connect TDR from, say, a Tek Scope to a transmission line (powered down) and look for anything out of the ordinary. Say, we have a connector, then a via, then a transmission line of known length, then
a via again, then a chip with 50 Ohm termination. Everything looks familiar. Once you see anything unfamiliar (and the TDR will let you easily judge, what it is - open, close, capacitance, wrong termination, wrong charact.
impedance, etc) - you know what you are dealing with.

Hey, Anritsu makes something like this. We use their BERTs.

Barry Ma wrote:

> Thanks Michael for your nice explanation.
>
> I just run into a reference:
> Dascher, D., "Measuring Parasitic Capacitance and Inductance Using TDR" HP Journal, April 1996, Article 11.
>
> The article is not available to me. That inspired me to ask a relevant question. Can anybody help me outlining the methodology used in the article?
>
> Maybe I should have asked a general question: How to find and measure a suspicious connection inside a working transmission line? Or, how to check on a working transmission line system to see if any part gets loosened.
>
> Best Regards,
> Barry Ma
> bma@anritsu.com
>
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