Re: [SI-LIST] : Measuring parasitic values

About this list Date view Thread view Subject view Author view

From: Barry Ma (barry_ma@altavista.com)
Date: Wed Sep 20 2000 - 15:02:34 PDT


On Wed, 20 September 2000, Barry Ma wrote:

> I just run into a reference:
> Dascher, D., "Measuring Parasitic Capacitance and Inductance Using TDR" HP Journal,
> April 1996, Article 11. The article is not available to me. That inspired me to ask a
> relevant question. Can anybody help me outlining the methodology used in the article?
 

With help from an esteemed colleague, I just got the article. Thanks a lot.

The purpose to read it is to check and see if we could do a better job using Network Analyzer in time domain.

Thanks.
Best Regards,
Barry Ma <bma@anritsu.com>
ANRITSU www.anritsu.com
Morgan Hill, CA 95037
Tel. 408-778-2000 x 4465
_______________________________________________________________________

Free Unlimited Internet Access! Try it now!
http://www.zdnet.com/downloads/altavista/index.html

_______________________________________________________________________

**** To unsubscribe from si-list or si-list-digest: send e-mail to
majordomo@silab.eng.sun.com. In the BODY of message put: UNSUBSCRIBE
si-list or UNSUBSCRIBE si-list-digest, for more help, put HELP.
si-list archives are accessible at http://www.qsl.net/wb6tpu
****


About this list Date view Thread view Subject view Author view

This archive was generated by hypermail 2b29 : Tue May 08 2001 - 14:29:32 PDT