Re: [SI-LIST] : Measuring parasitic values

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From: greg kimball (gkimball@indra.com)
Date: Wed Sep 20 2000 - 23:12:01 PDT


Barry-
Could you scan and post the aricle - sounds usefull.
Regards,
Greg Kimball
TI SPG

Barry Ma wrote:
>
> On Wed, 20 September 2000, Barry Ma wrote:
>
> > I just run into a reference:
> > Dascher, D., "Measuring Parasitic Capacitance and Inductance Using TDR" HP Journal,
> > April 1996, Article 11. The article is not available to me. That inspired me to ask a
> > relevant question. Can anybody help me outlining the methodology used in the article?
>
>
> With help from an esteemed colleague, I just got the article. Thanks a lot.
>
> The purpose to read it is to check and see if we could do a better job using Network Analyzer in time domain.
>
> Thanks.
> Best Regards,
> Barry Ma <bma@anritsu.com>
> ANRITSU www.anritsu.com
> Morgan Hill, CA 95037
> Tel. 408-778-2000 x 4465
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