From: Douglas C. Smith ([email protected])
Date: Mon Nov 06 2000 - 11:22:18 PST
Hi All,
Thought some of you would enjoy this month's Technical
Tidbit at http://www.dsmith.org. It
describes a method of measuring the effect of external EMI
(electromagnetic interference) on the internal circuits of
electronic equipment. Often thought to be a difficult job,
many times it can be done with simple techniques if
attention is paid to the technical details of the
measurement. Data is presented for one such measurement.
Also added to the site this month:
- ESD Symposium paper titled "ESD Immunity in System
Designs, System Field Experiences and Effects of PWB Layout"
under the "Technical Information and Downloads" heading.
- Pictures of Cambridge, MA, USA, site of the recent IEC
TC77B (high frequency immunity) committee meeting under the
"Miscellaneous" heading near the Zug and Veldhoven picture
links.
Doug
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--
-------------------------------------------------------
___ _ Doug Smith
\ / ) P.O. Box 1457
========= Los Gatos, CA 95031-1457
_ / \ / \ _ TEL/FAX: 408-356-4186/358-3799
/ /\ \ ] / /\ \ Mobile: 408-858-4528
| q-----( ) | o | Email: [email protected]
\ _ / ] \ _ / Website: http://www.dsmith.org
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