Re: [SI-LIST] : Measuring parasitic values

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From: Barry Ma ([email protected])
Date: Wed Sep 20 2000 - 15:02:34 PDT

On Wed, 20 September 2000, Barry Ma wrote:

> I just run into a reference:
> Dascher, D., "Measuring Parasitic Capacitance and Inductance Using TDR" HP Journal,
> April 1996, Article 11. The article is not available to me. That inspired me to ask a
> relevant question. Can anybody help me outlining the methodology used in the article?
 

With help from an esteemed colleague, I just got the article. Thanks a lot.

The purpose to read it is to check and see if we could do a better job using Network Analyzer in time domain.

Thanks.
Best Regards,
Barry Ma <[email protected]>
ANRITSU www.anritsu.com
Morgan Hill, CA 95037
Tel. 408-778-2000 x 4465
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