[SI-LIST] : Measuring noise with Differntial probe

Tadashi ARAI ([email protected])
Thu, 09 Sep 1999 20:57:19 +0900

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Hello SI-list members,

When I measure PWR-GND noise of high-frequency(~100MHz) IC, I have two
options.
One is using the standard Active (FET) probes, the other is using a
differential probe.

The results of two measurement are slightly different.

Which must I believe ?

//// /// // / / / / / / / / / /
Tadashi Arai//Platform Developing Dept.,Desktop Prd Div. Fujitsu Limited
[email protected] TEL:+81-42-370-7617 Inagi-shi, Tokyo, Japan
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Next message: [email protected]: "[SI-LIST] : Anyone doing SI simulations for Pentium II boards?"
Previous message: Pat Zabinski: "Re: [SI-LIST] : voltage measurements using a current probe"
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