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| International | German | Publication | Title |
| IEC | DIN IEC | 60122-1 | Quartz crystal units – A specification in the IEC Quality Assessment System for Electronic Components (IECQ) Part 1: Generic specification |
| IEC | DIN IEC | 60122-2 | Part 2: Guide to the use of quartz crystal units for frequency control and selection |
| IEC | DIN IEC | 60122-2-1 | Section 1: Quartz crystals for microprocessor clock supply |
| IEC | DIN IEC | 60122-2-1 |
Amendment No.1 Annex A: Limiting the drive level of crystal units used with digital gates and on-chip oscillators to permissible values |
| IEC | DIN IEC | 60122-3 | Part 3: Standard outlines and pin connections |
| IEC | DIN 45105T4 | 60283 | Methods for the measurement of frequency and equivalent resistance of unwanted resonances of filter crystal units |
| IEC | DIN EN | 60444-1 |
Measurement of quartz crystal unit parameters by zero phase technique in a p-network Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a p-network |
| IEC | DIN EN | 60444-2 | Part 2: Phase offset method for the measurement of two-terminal parameters of quartz crystal units |
| IEC | DIN EN | 60444-3 | Part 3: Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a p-network with compensation of the parallel capacitance C0 --- WITHDRAWN ! |
| IEC | DIN EN | 60444-4 | Part 4: Method for the measurement of load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units up to 30 MHz |
| IEC | DIN EN | 60444-5 | Part 5: Methods for measurement of quartz crystal devices for the determination of equivalent electrical parameters using automatic network analyser techniques and error correction |
| IEC | DIN EN | 60444-6 | Part 6: Measurement of drive level dependence (DLD) |
| IEC | - | 60689 | Measurements and test methods for 32 kHz quartz crystal units for wrist watches and standard values |
| IEC | DIN IEC | 61080 | Guide to the measurement of equivalent electrical parameters of quartz crystal units |
| IEC | DIN IEC | 61178-2 |
Quartz crystal units – A specification in the IEC Quality Assessment System for Electronic Components (IECQ) Part 2: Sectional specification – Capability approval |
| IEC | DIN IEC | 61178-2-1 | Part 2: Sectional specification –capability approval – Section 1: Blank detail specification |
| IEC | DIN IEC | 61178-3 | Part 3: Sectional specification – Qualification approval |
| IEC | DIN IEC | 61178-3-1 | Part 3: Sectional specification – Qualification approval – Section 1: Blank detail specification |
| IEC | DIN EN | 61240 | Piezoelectric devices: Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection – General rules |
| IEC | DIN EN | 61837-1 | Surface mounted piezoelectric devices for frequency control and selection – Standard outlines and terminal lead connections Part 1: Plastic moulded enclosure outlines |
| IEC | DIN EN | 61837-2 | Part 2: Ceramic enclosure outlines |
| EIA | -- | 512 | Standard Methods for Measurement of the Equivalent Electrical Parameters of Quartz Crystal Units, 1kHz to 1 GHz |
| IEEE | -- | 176 | IEEE Standard on Piezoelectricity |
| IEEE | -- | 177 | IEEE Standard Definitions and Methods of Measurement for Piezoelectric Vibrators |
| IEEE | -- | 1139 | IEEE Standard Definitions of Physical Quantities for Fundamental Frequency an Time Metrology |
| MIL | -- | PRF-3098H | Performance Specification: General Specification for Quartz Crystal Units |
| MIL | -- | PRF-3098H | Supplement 1: Specification sheets |
IEC International Electrotechnical Commission
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