[SI-LIST] : FW: [rfmeas] Antenna Parameter Measurement by Near-Field Techniqu es (fwd)

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From: Ron Miller (rmiller@Brocade.COM)
Date: Tue May 09 2000 - 09:57:11 PDT


With all the discussion on EMI, perhaps some may be intrested in this
antenna seminar.

Ron Miller

> -----Original Message-----
> From: Wayde Allen
> Sent: Tuesday, May 09, 2000 8:38 AM
> To: List: RF Measurement
> Subject: [rfmeas] Antenna Parameter Measurement by Near-Field
> Techniques (fwd)
>
>
> ---------- Forwarded message ----------
> Date: Mon, 08 May 2000 15:15:14 -0600
> From: Wendy Ortega <ortegaw@boulder.nist.gov>
> Subject: Antenna Parameter Measurement by Near-Field Techniques
>
> Space is still available for the upcoming
>
> Antenna Parameter Measurement by Near-Field Techniques Short Course
> May 16 - 18, 2000
>
> at the National Institute of Standards and Technology, 325 Broadway,
> Boulder,
> Colorado
>
> Course Description
>
> This course is designed for engineers and scientists concerned with the
> accurate measurement of antenna parameters. Major emphasis will be placed
> on
> the theory of near-field antenna-antenna interactions, applications to
> near-field scanning on planar, cylindrical, and spherical surfaces, and
> the
> computation of desired antenna characteristics from near-field data.
> Comparisons will be made of the planar, cylindrical, and spherical
> scanning
> methods, and the advantages and disadvantages of each will be discussed.
> In
> addition, the extrapolation method of determining absolute gain and
> polarization will be treated and probe pattern measurements discussed.
>
> The attendee should have a background equivalent to a Bachelor=s degree in
> engineering or physics.
>
>
>
> Tuesday May 16, 2000
>
> C Introduction to antenna and microwave measurements
>
> C Introduction to near-field measurements
>
> C Polarization - theory and measurements
>
> C Probe characterization
>
>
> Wednesday May 17, 2000
>
> C Planar near-field theory
>
> C Planar near-field measurements
>
> C Cylindrical near-field theory
>
> C In-depth laboratory tour
>
>
> Thursday May 18, 2000
>
> C Spherical near-field theory
>
> C Uncertainty analysis
>
> C Spherical and cylindrical near-field measurements
>
> C Discussion
>
>
> For further technical information contact Mike Francis (303) 497-5873,
> e-mail:
> <francis@boulder.nist.gov>.
>
> To register online:
> https://sales.nist.gov/conf/secure/CONF198/conf_register.htm
>
> Registration fee: $1000
>
> For general information contact Wendy Ortega Henderson (303) 497-3693,
> e-mail:
> ortegaw@boulder.nist.gov, fax: (303) 497-5222
>
>
> ________________________________________________________________________
>
> Wendy Ortega Henderson Voice: 303-497-3693
> Conference Program Manager FAX:
> 303-497-5222
> Public and Business Affairs Division, 346 Email:
> ortegaw@boulder.nist.gov
> National Institute of Standards and Technology
> 325 Broadway, Boulder, CO 80303 USA
> __________________________________________________________________
> Boulder Conference Website: http://www.boulder.nist.gov/blconf.htm
> Conference Website: http://www.nist.gov/conferences
> NIST Website: http://www.nist.gov
>
> "A pessimist sees the difficulty in every opportunity;
> an optimist sees the opportunity in every difficulty."
> -Winston Churchill-
>
>
> ________________________________________________________________________
>
> Wendy Ortega Henderson Voice: 303-497-3693
> Conference Program Manager FAX:
> 303-497-5222
> Public and Business Affairs Division, 346 Email:
> ortegaw@boulder.nist.gov
> National Institute of Standards and Technology
> 325 Broadway, Boulder, CO 80303 USA
> __________________________________________________________________
> Boulder Conference Website: http://www.boulder.nist.gov/blconf.htm
> Conference Website: http://www.nist.gov/conferences
> NIST Website: http://www.nist.gov
>
> "A pessimist sees the difficulty in every opportunity;
> an optimist sees the opportunity in every difficulty."
> -Winston Churchill-

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