RE: [SI-LIST] : Trace Impedance Selection

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From: John Spohnheimer (John.Spohnheimer@dalsemi.com)
Date: Tue May 09 2000 - 09:11:32 PDT


FYI - This message came through just at the time the SI-list began discussing near-field antenna measurements.
The RF measurement list address is rfmeas@tigger.boulder.nist.gov <rfmeas@tigger.boulder.nist.gov>

-----Original Message-----
From: Wayde Allen [mailto:wallen@boulder.nist.gov]
Sent: Tuesday, May 09, 2000 10:38 AM
To: List: RF Measurement
Subject: [rfmeas] Antenna Parameter Measurement by Near-Field Techniques (fwd)

---------- Forwarded message ----------
Date: Mon, 08 May 2000 15:15:14 -0600
From: Wendy Ortega <ortegaw@boulder.nist.gov>
Subject: Antenna Parameter Measurement by Near-Field Techniques

Space is still available for the upcoming

Antenna Parameter Measurement by Near-Field Techniques Short Course
May 16 - 18, 2000

at the National Institute of Standards and Technology, 325 Broadway, Boulder,
Colorado

Course Description

This course is designed for engineers and scientists concerned with the
accurate measurement of antenna parameters. Major emphasis will be placed on
the theory of near-field antenna-antenna interactions, applications to
near-field scanning on planar, cylindrical, and spherical surfaces, and the
computation of desired antenna characteristics from near-field data.
Comparisons will be made of the planar, cylindrical, and spherical scanning
methods, and the advantages and disadvantages of each will be discussed. In
addition, the extrapolation method of determining absolute gain and
polarization will be treated and probe pattern measurements discussed.

The attendee should have a background equivalent to a Bachelor=s degree in
engineering or physics.

Tuesday May 16, 2000

C Introduction to antenna and microwave measurements

C Introduction to near-field measurements

C Polarization - theory and measurements

C Probe characterization

Wednesday May 17, 2000

C Planar near-field theory

C Planar near-field measurements

C Cylindrical near-field theory

C In-depth laboratory tour

Thursday May 18, 2000

C Spherical near-field theory

C Uncertainty analysis

C Spherical and cylindrical near-field measurements

C Discussion

For further technical information contact Mike Francis (303) 497-5873, e-mail:
<francis@boulder.nist.gov>.

To register online:
https://sales.nist.gov/conf/secure/CONF198/conf_register.htm

Registration fee: $1000

For general information contact Wendy Ortega Henderson (303) 497-3693, e-mail:
ortegaw@boulder.nist.gov, fax: (303) 497-5222

 
________________________________________________________________________

Wendy Ortega Henderson Voice: 303-497-3693
Conference Program Manager FAX: 303-497-5222
Public and Business Affairs Division, 346 Email:
ortegaw@boulder.nist.gov
National Institute of Standards and Technology
325 Broadway, Boulder, CO 80303 USA
__________________________________________________________________
Boulder Conference Website: http://www.boulder.nist.gov/blconf.htm
Conference Website: http://www.nist.gov/conferences
NIST Website: http://www.nist.gov

"A pessimist sees the difficulty in every opportunity;
an optimist sees the opportunity in every difficulty."
-Winston Churchill-

________________________________________________________________________

Wendy Ortega Henderson Voice: 303-497-3693
Conference Program Manager FAX: 303-497-5222
Public and Business Affairs Division, 346 Email:
ortegaw@boulder.nist.gov
National Institute of Standards and Technology
325 Broadway, Boulder, CO 80303 USA
__________________________________________________________________
Boulder Conference Website: http://www.boulder.nist.gov/blconf.htm
Conference Website: http://www.nist.gov/conferences
NIST Website: http://www.nist.gov

"A pessimist sees the difficulty in every opportunity;
an optimist sees the opportunity in every difficulty."
-Winston Churchill-

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