From: John Spohnheimer ([email protected])
Date: Tue May 09 2000 - 09:11:32 PDT
FYI - This message came through just at the time the SI-list began discussing near-field antenna measurements.
The RF measurement list address is [email protected] <[email protected]>
-----Original Message-----
From: Wayde Allen [mailto:[email protected]]
Sent: Tuesday, May 09, 2000 10:38 AM
To: List: RF Measurement
Subject: [rfmeas] Antenna Parameter Measurement by Near-Field Techniques (fwd)
---------- Forwarded message ----------
Date: Mon, 08 May 2000 15:15:14 -0600
From: Wendy Ortega <[email protected]>
Subject: Antenna Parameter Measurement by Near-Field Techniques
Space is still available for the upcoming
Antenna Parameter Measurement by Near-Field Techniques Short Course
May 16 - 18, 2000
at the National Institute of Standards and Technology, 325 Broadway, Boulder,
Colorado
Course Description
This course is designed for engineers and scientists concerned with the
accurate measurement of antenna parameters. Major emphasis will be placed on
the theory of near-field antenna-antenna interactions, applications to
near-field scanning on planar, cylindrical, and spherical surfaces, and the
computation of desired antenna characteristics from near-field data.
Comparisons will be made of the planar, cylindrical, and spherical scanning
methods, and the advantages and disadvantages of each will be discussed. In
addition, the extrapolation method of determining absolute gain and
polarization will be treated and probe pattern measurements discussed.
The attendee should have a background equivalent to a Bachelor=s degree in
engineering or physics.
Tuesday May 16, 2000
C Introduction to antenna and microwave measurements
C Introduction to near-field measurements
C Polarization - theory and measurements
C Probe characterization
Wednesday May 17, 2000
C Planar near-field theory
C Planar near-field measurements
C Cylindrical near-field theory
C In-depth laboratory tour
Thursday May 18, 2000
C Spherical near-field theory
C Uncertainty analysis
C Spherical and cylindrical near-field measurements
C Discussion
For further technical information contact Mike Francis (303) 497-5873, e-mail:
<[email protected]>.
To register online:
https://sales.nist.gov/conf/secure/CONF198/conf_register.htm
Registration fee: $1000
For general information contact Wendy Ortega Henderson (303) 497-3693, e-mail:
[email protected], fax: (303) 497-5222
________________________________________________________________________
Wendy Ortega Henderson Voice: 303-497-3693
Conference Program Manager FAX: 303-497-5222
Public and Business Affairs Division, 346 Email:
[email protected]
National Institute of Standards and Technology
325 Broadway, Boulder, CO 80303 USA
__________________________________________________________________
Boulder Conference Website: http://www.boulder.nist.gov/blconf.htm
Conference Website: http://www.nist.gov/conferences
NIST Website: http://www.nist.gov
"A pessimist sees the difficulty in every opportunity;
an optimist sees the opportunity in every difficulty."
-Winston Churchill-
________________________________________________________________________
Wendy Ortega Henderson Voice: 303-497-3693
Conference Program Manager FAX: 303-497-5222
Public and Business Affairs Division, 346 Email:
[email protected]
National Institute of Standards and Technology
325 Broadway, Boulder, CO 80303 USA
__________________________________________________________________
Boulder Conference Website: http://www.boulder.nist.gov/blconf.htm
Conference Website: http://www.nist.gov/conferences
NIST Website: http://www.nist.gov
"A pessimist sees the difficulty in every opportunity;
an optimist sees the opportunity in every difficulty."
-Winston Churchill-
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