RE: [SI-LIST] : Conducted EMC Testing of PLL jitter

Farrokh Mottahedin (Farrokh.Mottahedin@quantum.com)
Wed, 9 Dec 1998 09:41:50 -0800

Ray,

Sorry for the delayed response. I have just confirmed that in addition to
being a passive sniffer of emissions, the close-field probe can be used as a
basic localized field source. In conjunction with a signal generator, the
probe provides a magnetic field for susceptibility testing of electronic
circuits. For broadband susceptibility testing, the probe may be used with
a swept or tracking source.

Regards,

Farrokh Mottahedin
Quantum Corporation
(408) 324-7934
farrokh.mottahedin@quantum.com