Not advertising this company but it has a very good article on frequency
domain characterization methodology.
For TDR methods refer to
AN1304-1 and AN1304-2 from
or visit Tektronix http://www.tek.com
I prefer to use TDR method as it gives unique values for LCR and it's
simpler. FD method uses MDS optimization algorithms to arrive at the LCR
values but I wonder if they are unique. FD method does give better
correlation if one uses higher order polynomials as models instead of
Warning: R is quite difficult to determine. And is dependent upon the
and tear on the socket pin contact with the pad, as well as contact
Intel Test Tooling Penang
From: Matt (boomer) Russell [mailto:email@example.com]
Sent: Thursday, September 02, 1999 3:13 AM
Subject: [SI-LIST] : BGA socket modeling
anyone have any approximate figures for BGA test socket LRC values
or how to model it.
I am trying to get info from the socket vendor, but all I seem
to be able to get is contact resistance and mechanical info.
**** To unsubscribe from si-list: send e-mail to firstname.lastname@example.org. In the BODY of message put: UNSUBSCRIBE si-list, for more help, put HELP. si-list archives are accessible at http://www.qsl.net/wb6tpu/si-list ****