As one of developers of that tool ...
Yes, it does account for proximity effect.
It is equivalent to PEEC or FastHenry in that it uses integral equation
method. However, SIMIAN uses effective impedance rather than internal
meshes
used in PEEC and FastHenry. The internal impedance of conductor is
characterized as of equivalent surface impedance, so it does represent
inside of conductor as of surface patch with effective internal
impedance.
So, SIMIAN does not need to mesh inside of conductors and, thus, shows
high
accuracy over high frequency spectrum with small number of unknowns.
FastHenry took the way of smart matrix assmebly and solver.
SIMIAN took the way of model domain reduction along with decreasing the
number of unknowns.
Regards,
Beom-Taek Lee
Intel Corporation
-----Original Message-----
From: Ray Anderson [mailto:raymonda@radium.eng.sun.com]
Sent: Thursday, August 05, 1999 11:32 AM
To: si-list@silab.eng.sun.com
Subject: Re: [SI-LIST] : Proposal: Rs correlation/collaboration for
W-Elements
Rich:
Here are some more data points for your comparison table, this time
simulated with the SIMIAN Version 2.1 tool developed at the University
of Texas, Austin.
Using the same input geometry as you suggested for the Microstrip
problem:
1.0769E-3 Ohms/sqrt(Hz)*meter @ 100MHz
1.3958e-3 Ohms/sqrt(Hz)*meter @ 1GHz
1.4815e-3 Ohms/sqrt(Hz)*meter @ 5GHz
Notes:
* The numbers include the effect of a lossy ground plane.
* The extractor accounts for proximity effect (I think).
* Rdc of 4.454 ohms/meter was backed out of the calculated #'s
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