Re: [SI-LIST] : Trace Capacitance

MikonCons@aol.com
Mon, 21 Jun 1999 13:00:11 EDT

Looks like a "pilot error" to me. The fringing capacitance would be
approximately the same in both measurements; hence, the second measurement
should be approximately four times the first one. An offset of 5 pf caused
by the measurement probes or an improper instrument zeroing (i.e., an offset)
would explain the error.

Try calculating the ideal capacitance for the presumably known dielectric
constant and dielectric thickness for a reality check.

Mike Conn
Owner/Principal Consultant
Mikon Consulting

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