RE: [SI-LIST] : differences in memory speeds

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From: Zabinski, Patrick J. (zabinski.patrick@mayo.edu)
Date: Tue Mar 13 2001 - 04:47:44 PST


Scott,

Thanks for the feedback. The various failure mechanisms you mentioned
are all under consideration, and we're trying to determine (with
a high degree of certainty) which mechanism(s) is the real problem
before we try coming up with a fix.

I like the hot/cold idea. This is a new one on me, and it looks
quite easy to do and useful.

Thanks,
Pat

>
> To verify that the failure is due to input threshold
> violations, you can do the
> following experiments:
>
> 1) use a heat gun to locally heat the devices which you
> believe are failing, without
> changing the temperature of the driver. You should see a
> reduced number of
> failures.
>
> 2) use freeze spray to locally cool the devices which you
> believe are failing, without
> changing the temperature of the driver. You should see an
> increased number of
> failures.
>
> 3) Use freeze spray to locally cool the driver, without
> changing the temperature of
> the receiver. This will increase the drive strength and
> speed of the driver, and
> should push the first incident pulse beyond the threshold
> area and allow the system
> to work.
>
>

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