[SI-LIST] : Static to dynamic field converter

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From: Douglas C. Smith ([email protected])
Date: Mon Jun 04 2001 - 21:18:29 PDT


Hi All,

It is amazing what can be accomplished with simple, inexpensive test
fixtures when it comes to debugging designs. The Technical Tidbit this
month on www.dsmith.org describes a simple structure that generates
repeatable, intense EMI useful for finding weaknesses in system designs.
It also makes a good science fair
project for a student. This article is a continuation of last month's
article titled "Hidden Threats to Electronic Equipment" and is located
near the bottom of the index page. The material cost for this gaget is
about US$1 and it takes just a few minutes to build.

Doug

-- 
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    ___          _       Doug Smith
     \          / )      P.O. Box 1457
      =========          Los Gatos, CA 95031-1457
   _ / \     / \ _       TEL/FAX: 408-356-4186/358-3799
 /  /\  \ ] /  /\  \     Mobile:  408-858-4528
|  q-----( )  |  o  |    Email:   [email protected]
 \ _ /    ]    \ _ /     Website: http://www.dsmith.org
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