Design

 

 

 

The first step taken in implementing the Bell bandgap in Mosis 0.18 micron process was to determine the resistor values required to case the output voltage to minimize temperature independence. To determine the resistor values one needs to obtain the process parameters

eta, and Ege.

 

From The equations described in the Bell section of the Web page, we need to calculate Vptat at To.

 

 

 


                                                                                                   

Given the Mosis 0.18 process parameters, the Vptat voltage required is 600mV.

The resistor values required are calculated from the Vptat and delta Vbe.

 

 

 


This bandgap requires two lateral PNP transistors. Actually, it requires 48 lateral transistors in parallel.  The Mosis 0.18 micron process does not support lateral PNPs directly. One has to use a MOS transistor operated as a lateral bipolar [10].  This lateral bipolar requires special care in layout. The actual layout of the lateral PNP is shown in figure 1. Unfortunately, there are two parasitic vertical PNPs that are also present in the layout. These vertical transistors cause a leak into the substrate, which could effect the output of the bandgap. I spent significant amount of time trying to determine the effects of this by using the lateral PNP models from [11].

 

Fig 1.

Figure 1

 

Because the gates of the M7 and M10 in the schematic are in an unknown state when the bandgap powers up, a startup circuit is required. The startup circuit was actually the more difficult part of the design. Because the Mosis 0.18u process design rules have restrictions on mosfet length minimum and maximum ratios, creating the weak pull-up transistor was a challenge. The startup circuit is basically a pseudo nmos inverter. When the bandgap initially is powered, the weak pull-up transistor drives the gate voltage of Msu2 high turning Msu2 on. The current through Msu2 pulls the gates of the current mirrors of the bandgap down, forcing the current mirrors on. The output voltage then starts to rise. Once the output reaches the trigger level of the inverter, the inverter output goes low. This shuts off the current in Msu2. By this time the current mirrors are sustaining their own currents. The simulation plots in Fig. 2. Show the startup circuit in action. The spike on the graph of N4 is startup circuit energizing the bandgap. Onc can observe the VREF voltage jumping after the N4 spike. The bandgap could start up without the startup circuit, but this would be a game of chance.

 

Figure 2  

A plot of the output vs. temperature is shown in figure 3. You can see that the bandgap is only accurate near T=300K as theory would predict. 

 

 

 

 

 

The layout of a bandgap is more demanding than that of say a digital core. All the transistors need to be matched as closely as possible. Variations in production can cause mismatches in transistors that translate into effecting the temeprature independance of the output. To improve transistor matching dummy poly, dummy tansistors, and common centrioding techniques were used.

 

 

As an examplein figure 5, an extra ring of bipolar transistors was added around the 7x7 array of bipolars to protect the itransistors inside the ring from procsses variations.

 

 

I also had to create my own analog ESD pads for the Mosis 0.18 process. Mosis had not yet released a pad library for this process. I took the Mosis pad library from the 0.25 process and made changes. Because this is from a larger process almost all the design rules were satisfied. The one major exception was the via and contact sizes. So, I exported the pad layouts to the CIF format, and read the file with the emacs editor. Using automatic search and replace, I replaced the via and contacts with new vias and contacts of the correct size. Once complete there were few remaing DRC errors left in the PADS that had to be corrected manually.